Список статей

Выпуск Название Файл
Том 50, № 5 (2016) Anisotropy of the thermal expansion of CuIn5Se8 single crystals in two structural modifications
Bodnar I.
Том 51, № 8 (2017) Anisotropy of the thermopower in higher silicide of transitions metals
Kusnetsova V., Zaitsev V., Solomkin F., Novikov S.
Том 52, № 14 (2018) Annealing of FIB-Induced Defects in GaAs/AlGaAs Heterostructure
Levitskii I., Mitrofanov M., Voznyuk G., Nikolaev D., Mizerov M., Evtikhiev V.
Том 51, № 1 (2017) Anodes for Li-ion batteries based on p-Si with self-organized macropores
Preobrazhenskiy N., Astrova E., Pavlov S., Voronkov V., Rumyantsev A., Zhdanov V.
Том 53, № 2 (2019) Anodic Oxidation of Hydrogen-Transferred Silicon-on-Insulator Layers
Tyschenko I., Popov I., Spesivtsev E.
Том 51, № 4 (2017) Anodic processes in the chemical and electrochemical etching of Si crystals in acid-fluoride solutions: Pore formation mechanism
Ulin V., Ulin N., Soldatenkov F.
Том 50, № 6 (2016) Anomalous thermoelectric power in Hg3In2Te6 crystals
Grushka O.
Том 51, № 12 (2017) Antimony segregation in Si layers grown by molecular beam epitaxy on Si wafers with different crystallographic orientations
Yurasov D., Drozdov M., Shmagin V., Novikov A.
Том 53, № 5 (2019) Antisite Defects in Ge–Te and Ge–As–Te Semiconductor Glasses
Marchenko A., Seregin P., Terukov E., Shakhovich K.
Том 51, № 1 (2017) Application of B12N12 and B12P12 as two fullerene-like semiconductors for adsorption of halomethane: Density functional theory study
Rad A.
Том 52, № 11 (2018) Application of the Locally Nonequilibrium Diffusion-Drift Cattaneo–Vernotte Model to the Calculation of Photocurrent Relaxation in Diode Structures under Subpicosecond Pulses of Ionizing Radiation
Puzanov A., Obolenskiy S., Kozlov V.
Том 53, № 14 (2019) Arsenic Diffusion in the Natural Oxidation of the Heavily Defected GaAs Surface
Mikoushkin V., Solonitsyna A., Makarevskaya E., Novikov D.
Том 50, № 1 (2016) Assessment of the resistance to diffusion destruction of AlAs/GaAs nanoscale resonant-tunneling heterostructures by IR spectral ellipsometry
Makeev M., Ivanov Y., Meshkov S.
Том 50, № 12 (2016) Asymmetric devices based on carbon nanotubes for terahertz-range radiation detection
Fedorov G., Stepanova T., Gazaliev A., Gaiduchenko I., Kaurova N., Voronov B., Goltzman G.
Том 51, № 1 (2017) Atomic and electronic structure of the CdTe(111)B–(2√3 × 4) orthogonal surface
Bekenev V., Zubkova S.
Том 50, № 12 (2016) Atomic composition and electrical characteristics of epitaxial CVD diamond layers doped with boron
Surovegina E., Demidov E., Drozdov M., Murel A., Khrykin O., Shashkin V., Lobaev M., Gorbachev A., Viharev A., Bogdanov S., Isaev V., Muchnikov A., Chernov V., Radishchev D., Batler D.
Том 51, № 3 (2017) Atomic configuration and charge state of hydrogen at dislocations in silicon
Vysotskii N., Loshachenko A., Vyvenko O.
Том 52, № 16 (2018) Atomic Force Microscopy Local Oxidation of GeO Thin Films
Astankova K., Kozhukhov A., Gorokhov E., Azarov I., Latyshev A.
Том 52, № 16 (2018) Atomic Force Microscopy Study of Monodisperse Carbon Nanoparticles
Muravijova D., Ermakov I., Eurov D., Kirilenko D., Kurdyukov D., Rabchinskii M., Shvidchenko A., Trofimuk A., Baidakova M.
Том 50, № 5 (2016) Atomic steps on an ultraflat Si(111) surface upon sublimation
Sitnikov S., Latyshev A., Kosolobov S.
Том 52, № 12 (2018) Avalanche Breakdown Stability of High Voltage (1430 V) 4H-SiC p+n0n+ Diodes
Ivanov P., Samsonova T., Potapov A.
Том 52, № 9 (2018) Backward-Diode Heterostructure Based on a Zinc-Oxide Nanoarray Formed by Pulsed Electrodeposition and a Cooper-Iodide Film Grown by the SILAR Method
Klochko N., Kopach V., Khrypunov G., Korsun V., Lyubov V., Zhadan D., Otchenashko A., Kirichenko M., Khrypunov M.
Том 52, № 5 (2018) Ballistic Hole Emission Spectroscopy of Self-Assembled GeSi/Si(001) Nanoislands
Filatov D., Guseinov D., Chalkov V., Denisov S., Shengurov V.
Том 51, № 1 (2017) Ballistic magnetotransport in a suspended two-dimensional electron gas with periodic antidot lattices
Zhdanov E., Pogosov A., Budantsev M., Pokhabov D., Bakarov A.
Том 52, № 12 (2018) Behavioral Features of MIS Memristors with a Si3N4 Nanolayer Fabricated on a Conductive Si Substrate
Tikhov S., Gorshkov O., Antonov I., Tetelbaum D., Mikhaylov A., Belov A., Morozov A., Karakolis P., Dimitrakis P.
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