Issue |
Title |
File |
Vol 53, No 12 (2019) |
Deposition of Amorphous and Microcrystalline Films of Silicon by the Gas-Jet Plasma-Chemical Method |
|
Shchukin V.G., Konstantinov V.O., Sharafutdinov R.G.
|
Vol 53, No 1 (2019) |
Deposition of Silicon Films Doped with Boron and Phosphorus by the Gas-Jet Plasma-Chemical Method |
|
Shchukin V.G., Sharafutdinov R.G., Konstantinov V.O.
|
Vol 51, No 9 (2017) |
Derivation of an analytical expression for a physical process from an experimental curve with kinks |
|
Davydov V.N., Kharitonov S.V., Lugina N.E., Melnik K.P.
|
Vol 53, No 15 (2019) |
Determination of the Bulk Conductivity of III–V Semiconductors in a Strong Constant Electric Field and under Harmonic Effects |
|
Malyshev I.V., Fil K.A., Goncharova O.A.
|
Vol 53, No 11 (2019) |
Determination of the Free Charge Carrier Concentration in Boron-Doped Silicon Nanowires Using Attenuated Total Reflection Infrared Spectroscopy |
|
Lipkova E.A., Efimova A.I., Gonchar K.A., Presnov D.E., Eliseev A.A., Lapshin A.N., Timoshenko V.Y.
|
Vol 53, No 1 (2019) |
Determination of the Parameters of Metal–Insulator–Semiconductor Structures with Ultrathin Insulating Layer from High-Frequency Capacitance–Voltage Measurements |
|
Goldman E.I., Kuharskaya N.F., Levashov S.A., Chucheva G.V.
|
Vol 52, No 13 (2018) |
Determination of the Region of Thermal Stability of the Size and Phase Composition of Silver-Sulfide Semiconductor Nanoparticles |
|
Sadovnikov S.I., Vovkotrub E.G.
|
Vol 51, No 8 (2017) |
Determination of the thermoelectric efficiency of thermoelectric materials from measurements of linear series of branches for n- and p-types of conductivity |
|
Lebedev Y.P., Ivanov A.S., Il’in A.S., Chuyko A.G.
|
Vol 52, No 1 (2018) |
Determination of Thermodynamic Parameters in the Cu1.95Ni0.05S Phase-Transition Regions |
|
Aliev F.F., Hasanov H.A., Rzaeva A.G., Jafarov M.B., Damirov G.M.
|
Vol 52, No 15 (2018) |
Determining the Concentration of Free Electrons in n-InSb from Far-Infrared Reflectance Spectra with Allowance for Plasmon–Phonon Coupling |
|
Belova I.M., Belov A.G., Kanevsky V.E., Lysenko A.P.
|
Vol 51, No 13 (2017) |
Determining the Free Carrier Density in CdxHg1–xTe Solid Solutions from Far-Infrared Reflection Spectra |
|
Belov A.G., Denisov I.A., Kanevskii V.E., Pashkova N.V., Lysenko A.P.
|
Vol 52, No 10 (2018) |
Determining the Hydrogen Concentration from the Photovoltage of Pd–Oxide–InP MIS Structures |
|
Grebenshchikova E.A., Salikhov K.M., Sidorov V.G., Shutaev V.A., Yakovlev Y.P.
|
Vol 51, No 8 (2017) |
Development of a mathematical model for optimizing the design of an automotive thermoelectric generator taking into account the influence of its hydraulic resistance on the engine power |
|
Poshekhonov R.A., Arutyunyan G.A., Pankratov S.A., Osipkov A.S., Onishchenko D.O., Leontyev A.I.
|
Vol 52, No 11 (2018) |
Development of a Physical-Topological Model for the Response of a High-Power Vertical DMOS Transistor to the Effect of Pulsed Gamma-Radiation |
|
Khananova A.V., Obolensky S.V.
|
Vol 53, No 7 (2019) |
Development of the Physicochemical Properties of the GaSb(100) Surface in Ammonium Sulfide Solutions |
|
Lebedev M.V., Lvova T.V., Shakhmin A.L., Rakhimova O.V., Dementev P.A., Sedova I.V.
|
Vol 53, No 13 (2019) |
Diameter Dependent Electronic, Optical and Transport Properties of CdSe Nanowire: Ab-Initio Study |
|
Khan M.S., Srivastava A.
|
Vol 53, No 16 (2019) |
Dielectric Measurements of Polymer Composite Based on CdS Quantum Dots in Low Density Polyethylene at Microwave Frequencies |
|
Ushakov N.M., Kosobudsky I.D.
|
Vol 52, No 2 (2018) |
Dielectric Properties and Conductivity of Ag-Doped TlGaS2 Single Crystals |
|
Mustafaeva S.N., Asadov S.M., Kerimova E.M.
|
Vol 50, No 10 (2016) |
Dielectric properties of DNA oligonucleotides on the surface of silicon nanostructures |
|
Bagraev N.T., Chernev A.L., Klyachkin L.E., Malyarenko A.M., Emel’yanov A.K., Dubina M.V.
|
Vol 50, No 9 (2016) |
Dielectric properties of layered FeGaInS4 single crystals in an alternating electric field |
|
Mammadov F.M., Niftiyev N.N.
|
Vol 52, No 7 (2018) |
Dielectric Properties of Nanocrystalline Tungsten Oxide in the Temperature Range of 223–293 K |
|
Kozyukhin S.A., Bedin S.A., Rudakovskaya P.G., Ivanova O.S., Ivanov V.K.
|
Vol 52, No 5 (2018) |
Dielectric Properties of Oligonucleotides on the Surface of Si Nanosandwich Structures |
|
Fomin M.A., Chernev A.L., Bagraev N.T., Klyachkin L.E., Emelyanov A.K., Dubina M.V.
|
Vol 52, No 8 (2018) |
Dielectric Relaxation in Thin Layers of the Ge28.5Pb15S56.5 Glassy System |
|
Castro R.A., Anisimova N.I., Kononov A.A.
|
Vol 53, No 7 (2019) |
Differences in the Impurity Ionization in Quasi-Classically Strong Constant and Alternating Electric Fields in a Two-Dimensional Superlattice Based on Graphene |
|
Badikova P.V., Glazov S.Y., Syrodoev G.A.
|
Vol 53, No 16 (2019) |
Differential Absorption Features of CdSe QDs in the Case of Resonant and Nonresonant Excitons Excitation |
|
Smirnov A.M., Golinskaya A.D., Zharkova E.V., Bubenov S.S., Dorofeev S.G., Dneprovskii V.S.
|
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