Atomic steps on an ultraflat Si(111) surface upon sublimation
- Authors: Sitnikov S.V.1, Latyshev A.V.1,2, Kosolobov S.S.1
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Affiliations:
- Rzhanov Institute of Semiconductor Physics, Siberian Branch
- Novosibirsk State University
- Issue: Vol 50, No 5 (2016)
- Pages: 596-600
- Section: Surfaces, Interfaces, and Thin Films
- URL: https://journals.rcsi.science/1063-7826/article/view/197068
- DOI: https://doi.org/10.1134/S1063782616050201
- ID: 197068
Cite item
Abstract
The kinetics of atomic steps on an ultraflat Si(111) surface is studied by in situ ultrahigh-vacuum reflection electron microscopy at temperatures of 1050–1350°C. For the first time it is experimentally shown that the rate of displacement of an atomic step during sublimation nonlinearly depends on the width of the adjacent terrace. It is established that the atomic mechanism of mass-transport processes at the surface at temperatures higher than 1200°C is controlled by nucleation and the diffusion of surface vacancies rather than of adsorbed Si atoms. The studies make it possible to estimate the activation energy of the dissolution of vacancies from the surface into the bulk of Si. The estimated activation energy is (4.3 ± 0.05) eV.
About the authors
S. V. Sitnikov
Rzhanov Institute of Semiconductor Physics, Siberian Branch
Author for correspondence.
Email: sitnikov@isp.nsc.ru
Russian Federation, Novosibirsk, 630090
A. V. Latyshev
Rzhanov Institute of Semiconductor Physics, Siberian Branch; Novosibirsk State University
Email: sitnikov@isp.nsc.ru
Russian Federation, Novosibirsk, 630090; Novosibirsk, 630090
S. S. Kosolobov
Rzhanov Institute of Semiconductor Physics, Siberian Branch
Email: sitnikov@isp.nsc.ru
Russian Federation, Novosibirsk, 630090