Email this article Determining the Free Carrier Density in CdxHg1–xTe Solid Solutions from Far-Infrared Reflection Spectra
- Authors: Belov A.G.1, Denisov I.A.1, Kanevskii V.E.1, Pashkova N.V.1, Lysenko A.P.2
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Affiliations:
- AO State Scientific Research and Design Institute of Rare Metal Industry “Giredmet”
- National Research University “Higher School of Economics”
- Issue: Vol 51, No 13 (2017)
- Pages: 1732-1736
- Section: Methods and Technique of Measurements
- URL: https://journals.rcsi.science/1063-7826/article/view/202174
- DOI: https://doi.org/10.1134/S1063782617130048
- ID: 202174
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Abstract
A new contactless nondestructive technique for determining the free carrier density in single-crystal samples of CdxHg1–xTe solid solutions and multilayer epitaxial heterostructures based on them from farinfrared reflection spectra is proposed. The characteristic point and corresponding wavenumber in the room-temperature spectral dependence of the reflectance are determined. The heavy hole density is established using calculated calibration curves. It is shown that in constructing the calibration curves, it is necessary to take into account the interaction of plasma oscillations with longitudinal optical phonons.
About the authors
A. G. Belov
AO State Scientific Research and Design Institute of Rare Metal Industry “Giredmet”
Email: aplysenko@hse.ru
Russian Federation, Moscow, 119017
I. A. Denisov
AO State Scientific Research and Design Institute of Rare Metal Industry “Giredmet”
Email: aplysenko@hse.ru
Russian Federation, Moscow, 119017
V. E. Kanevskii
AO State Scientific Research and Design Institute of Rare Metal Industry “Giredmet”
Email: aplysenko@hse.ru
Russian Federation, Moscow, 119017
N. V. Pashkova
AO State Scientific Research and Design Institute of Rare Metal Industry “Giredmet”
Email: aplysenko@hse.ru
Russian Federation, Moscow, 119017
A. P. Lysenko
National Research University “Higher School of Economics”
Author for correspondence.
Email: aplysenko@hse.ru
Russian Federation, Moscow, 101000
