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Issue Title File
Vol 45, No 8-9 (2016) Influence of the yttria dopant on the structure and properties of (ZrO2)0.91–x(Sc2O3)0.09(Y2O3)х (x = 0–0.02) crystals
Agarkov D.A., Seryakov S.V., Myzina V.A., Milovich F.O., Lomonova E.E., Kuritsyna I.E., Kulebyakin A.V., Iskhakova L.D., Bublik V.T., Bredikhin S.I., Borik M.A., Tabachkova N.Y.
Vol 46, No 4 (2017) Integrated optical-controlled diamond sensors
Tsukanov A.V.
Vol 45, No 6 (2016) Integration of functional elements of resistive nonvolative memory with 1T-1R topology
Negrov D.V., Kirtaev R.V., Kiseleva I.V., Kondratyuk E.V., Shadrin A.V., Zenkevich A.V., Orlov O.M., Gornev E.S., Krasnikov G.Y.
Vol 45, No 7 (2016) Intelligent system and electron components for controlling individual heat consumption
Shtern Y.I., Kozhevnikov Y.S., Rygalin D.B., Shtern M.Y., Karavaev I.S., Rogachev M.S.
Vol 48, No 4 (2019) Inter-Device Radiation-Induced Leakages in the Bulk 180-nm CMOS Technology
Boruzdina A.B., Gerasimov Y.M., Grigor’ev N.G., Kobylyatskii A.V., Ulanova A.V., Shvetsov-Shilovskii I.I.
Vol 48, No 8 (2019) Inverse-Coefficient Problem of Heat Transfer in Layered Nanostructures
Abgaryan K.K., Noskov R.G., Reviznikov D.L.
Vol 47, No 3 (2018) Investigating the Dynamic Characteristics of High-Temperature SOI CMOS VLSIC Elements
Benediktov A.S., Shelepin N.A., Ignatov P.V., Mikhailov A.A., Potupchik A.G.
Vol 46, No 1 (2017) Investigation into the processes of plasmachemical etching of a photoresist with the help of in situ optical monitoring
Volkov P.V., Zelentsov S.V., Korolyov S.A., Luk’yanov A.Y., Okhapkin A.I., Tropanova A.N.
Vol 47, No 5 (2018) Investigation of a Capacitor Array of a Composite Capacitive Touch Panel
Vlasov A.I., Krivoshein A.I., Terent’ev D.S., Shakhnov V.A.
Vol 47, No 6 (2018) Investigation of Alloyed Ohmic Contacts in Epitaxial Tellurium-Doped Gallium Arsenide Layers
Egorkin V.I., Zemlyakov V.E., Nezhentsev A.V., Garmash V.I., Kalyuzhnyi N.A., Mintairov S.A.
Vol 47, No 5 (2018) Investigation of Characteristics of Electrostatically Actuated MEMS Switch with an Active Contact Breaking Mechanism
Uvarov I.V., Kupriyanov A.N.
Vol 45, No 8-9 (2016) Investigation of ion-electron emission in the process of reactive ion-beam etching of dielectric thin film heterostructures
Kurochka A.S., Sergienko A.A., Kurochka S.P.
Vol 46, No 1 (2017) Investigation of textured aluminum nitride films prepared by chemical vapor deposition
Red’kin A.N., Ryzhova M.V., Yakimov E.E., Roshchupkin D.V.
Vol 46, No 5 (2017) Investigation of the features of integrating nonvolatile FRAM elements with CMOS technology
Orlov O.M., Voronov D.D., Izmailov R.A., Krasnikov G.Y.
Vol 45, No 3 (2016) Investigation of the impact of plasma etching steps on the roughness of the fin FET channel sidewalls in the scheme of hetero-integration
Baranov G.V., Milenin A.P., Baklanov M.P.
Vol 47, No 5 (2018) Investigation of the Process of Plasma Through Etching of HkMG Stack of Nanotransistor with a 32-nm Critical Dimension
Myakonkikh A.V., Kuvaev K.Y., Tatarintsev A.A., Orlikovskii N.A., Rudenko K.V., Guschin O.P., Gornev E.S.
Vol 45, No 4 (2016) Investigation of the properties and manufacturing features of nonvolatile FRAM memory based on atomic layer deposition
Orlov O.M., Markeev A.M., Zenkevich A.V., Chernikova A.G., Spiridonov M.V., Izmaylov R.A., Gornev E.S.
Vol 46, No 8 (2017) Is It not Time to Go back to Tamman’s Tg?
Minaev V.S., Parfenov N.M., Timoshenkov S.P., Vassiliev V.P., Kalugin V.V., Mukimov D.Z.
Vol 48, No 7 (2019) Junctionless MOS-Transistor with a Low Subthreshold Current
Korolev M.A., Klyuchnikov A.S., Efimova D.I.
Vol 45, No 2 (2016) Kinetics of growth and plasma destruction of polymer films deposited in a glow discharge in methane
Barinov S.M., Efremov A.M.
Vol 45, No 4 (2016) Kinetics of neutral particles in HCl and HBr plasmas at low pressures and high electron concentrations
Efremov A.M.
Vol 45, No 5 (2016) Kinetics of the interaction between a CCl2F2 radio-frequency discharge and gallium arsenide
Pivovarenok S.A., Dunaev A.V., Murin D.B.
Vol 47, No 3 (2018) Laser Method of Evaluating Parameters of LSI Sensitivity to the Impact of Single Ions
Chumakov A.I.
Vol 48, No 3 (2019) Layout Synthesis Design Flow for Special-Purpose Reconfigurable Systems-on-a-Chip
Gavrilov S.V., Zheleznikov D.A., Zapletina M.A., Khvatov V.M., Chochaev R.Z., Enns V.I.
Vol 48, No 3 (2019) Logical C-Element on STG DICE Trigger for Asynchronous Digital Devices Resistant to Single Nuclear Particles
Katunin Y.V., Stenin V.Y.
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