| Edição |
Título |
Arquivo |
| Volume 46, Nº 5 (2017) |
Effect of diamond dicing of SiC device wafers on the technical and operational parameters of monolithic integrated circuits |
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Gamkrelidze S., Trofimov A., Shchavruk N.
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| Volume 48, Nº 2 (2019) |
Effect of the Built-in Surface Potential on the I–V Characteristics of Silicon MIS Structures |
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Yafarov R.
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| Volume 48, Nº 4 (2019) |
Effect of the Composition on the Dielectric Properties and Charge Transfer in 2D GaS1 –хSeх Materials |
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Asadov S., Mustafaeva S., Lukichev V., Guseinov D.
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| Volume 47, Nº 4 (2018) |
Effect of the Distribution of the Radiation Defect on the Field-Emission Properties of Silicon Crystals |
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Yafarov R., Timoshenkov V.
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| Volume 48, Nº 2 (2019) |
Effect of the Fermi Surface Anisotropy on the Electrical Conductivity of a Thin Inhomogeneous Metal Wire |
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Kuznetsova I., Romanov D., Yushkanov A.
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| Volume 46, Nº 6 (2017) |
Effect of the Measuring Signal Parameters on the Error in Capacitance Measurements of a p-n Transition and Determining Its Resistance to Radiation |
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Zabavichev I., Obolensky S.
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| Volume 46, Nº 4 (2017) |
Effect of the mixture composition on the electrophysical parameters and emission spectra of CF2Cl2/Ar and CF2Cl2/He plasma |
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Pivovarenok S.
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| Volume 48, Nº 8 (2019) |
Effect of the Phase Composition and Local Crystal Structure on the Transport Properties of the ZrO2–Y2O3 and ZrO2–Gd2O3 Solid Solutions |
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Agarkova E., Ryabochkina P., Myzina V., Milovich F., Lomonova E., Larina N., Kuritsyna I., Kulebyakin A., Volkova T., Bublik V., Borik M., Tabachkova N.
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| Volume 48, Nº 6 (2019) |
Effect of the Pressure of Oxygen on the Plasma Oxidation of the Titanium Nitride Surface |
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Mordvintsev V., Naumov V., Simakin S.
|
| Volume 45, Nº 5 (2016) |
Effect of the reflection coefficients on the conductivity of a thin metal layer in the case of an inhomogeneous time-periodic electric field |
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Utkin A., Yushkanov A.
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| Volume 45, Nº 7 (2016) |
Efficiency of frequency transformation on MOS transistors with a built-in channel under intensively handicapped radioreception |
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Zhuravlev D., Mushta A.
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| Volume 48, Nº 8 (2019) |
Electrical Performance Improvement of Lead-Acid Battery under the Impact of Micro Carbon Additives |
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Kuzmenko A., Grechushnikov E., Kharseev V., Salnikov A.
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| Volume 45, Nº 6 (2016) |
Electrical properties of a TiN/TixAl1 – xOy/TiN memristor device manufactured by magnetron sputtering |
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Bobylev A., Udovichenko S.
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| Volume 47, Nº 8 (2018) |
Electromagnetic and Mechanical Properties of the Nanocomposites of Polyacrylonitrile/Carbon Nanotubes |
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Kozhitov L., Shadrinov A., Muratov D., Korovin E., Popkova A.
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| Volume 46, Nº 6 (2017) |
Electromagnetic Modeling, Technology, and Production of Microwave C3MOSHFET Switches on AlGaN/GaN Heterostructures |
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Adonin A., Evgrafov A., Minnebaev V., Ivashchenko N., Myakon’kikh A., Rogozhin A., Rudenko K.
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| Volume 46, Nº 6 (2017) |
Electronic Structure of Molecular Switches on Splitters Based on trans-Polyacetylene |
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Gorbatsevich A., Zhuravlev M., Kataeva T.
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| Volume 47, Nº 2 (2018) |
Electrophysical Parameters and Radiation Spectra of Boron Trichloride Plasma |
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Murin D., Dunaev A.
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| Volume 46, Nº 2 (2017) |
Element base of quantum informatics I. Qubits of a quantum computer based on single atoms in optical traps |
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Ryabtsev I., Beterov I., Yakshina E., Tretyakov D., Entin V., Neizvestny I., Latyshev A., Aseev A.
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| Volume 46, Nº 2 (2017) |
Element base of quantum informatics II: Quantum communications with single photons |
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Ryabtsev I., Tretyakov D., Kolyako A., Pleshkov A., Entin V., Neizvestny I., Latyshev A., Aseev A.
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| Volume 46, Nº 4 (2017) |
Erratum to: “Influence of external conditions on physical processes and plasma parameters in a model of a high-frequency hybrid plasma system” |
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Aleksandrov A., Petrov A., Vavilin K., Kral’kina E., Neklyudova P., Nikonov A., Pavlov V., Airapetov A., Odinokov V., Pavlov G., Sologub V.
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| Volume 46, Nº 4 (2017) |
Erratum to: “Thin film negative electrode based on silicon composite for lithium-ion batteries” |
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Airapetov A., Vasiliev S., Kulova T., Lebedev M., Metlitskaya A., Mironenko A., Nikol’skaya N., Odinokov V., Pavlov G., Pukhov D., Rudyi A., Skundin A., Sologub V., Fedorov I., Churilov A.
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| Volume 46, Nº 4 (2017) |
Erratum to: “Thin-film positive electrode based on vanadium oxides for lithium-ion accumulators” |
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Vasil’ev S., Gerashchenko V., Kulova T., Lebedev M., Mazaletskii L., Metlitskaya A., Mironenko A., Moskovskii S., Nikol’skaya N., Pukhov D., Rudyi A., Skundin A., Sologub V., Fedorov I., Churilov A.
|
| Volume 48, Nº 6 (2019) |
Estimating the Electric Mode Effect (Active and Passive) on the Dose of Radiation Resistance of Microcircuits |
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|
Kalashnikov O.
|
| Volume 48, Nº 4 (2019) |
Estimating the Interrelation between the Rate of Atomic Layer Deposition of Thin Platinum-Group Metal Films and the Molecular Mass of Reactant Precursors |
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Vasilyev V.
|
| Volume 47, Nº 6 (2018) |
Etching of GaAs in the Plasma of a Freon R-12–Argon (CCl2F2/Ar) Mixture |
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Murin D., Dunaev A.
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