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Issue Title File
Vol 46, No 5 (2017) Effect of diamond dicing of SiC device wafers on the technical and operational parameters of monolithic integrated circuits
Gamkrelidze S.A., Trofimov A.A., Shchavruk N.V.
Vol 48, No 2 (2019) Effect of the Built-in Surface Potential on the I–V Characteristics of Silicon MIS Structures
Yafarov R.K.
Vol 48, No 4 (2019) Effect of the Composition on the Dielectric Properties and Charge Transfer in 2D GaS1 –хSeх Materials
Asadov S.M., Mustafaeva S.N., Lukichev V.F., Guseinov D.T.
Vol 47, No 4 (2018) Effect of the Distribution of the Radiation Defect on the Field-Emission Properties of Silicon Crystals
Yafarov R.K., Timoshenkov V.P.
Vol 48, No 2 (2019) Effect of the Fermi Surface Anisotropy on the Electrical Conductivity of a Thin Inhomogeneous Metal Wire
Kuznetsova I.A., Romanov D.N., Yushkanov A.A.
Vol 46, No 6 (2017) Effect of the Measuring Signal Parameters on the Error in Capacitance Measurements of a p-n Transition and Determining Its Resistance to Radiation
Zabavichev I.Y., Obolensky S.V.
Vol 46, No 4 (2017) Effect of the mixture composition on the electrophysical parameters and emission spectra of CF2Cl2/Ar and CF2Cl2/He plasma
Pivovarenok S.A.
Vol 48, No 8 (2019) Effect of the Phase Composition and Local Crystal Structure on the Transport Properties of the ZrO2–Y2O3 and ZrO2–Gd2O3 Solid Solutions
Agarkova E.A., Ryabochkina P.A., Myzina V.A., Milovich F.O., Lomonova E.E., Larina N.A., Kuritsyna I.E., Kulebyakin A.V., Volkova T.V., Bublik V.T., Borik M.A., Tabachkova N.Y.
Vol 48, No 6 (2019) Effect of the Pressure of Oxygen on the Plasma Oxidation of the Titanium Nitride Surface
Mordvintsev V.M., Naumov V.V., Simakin S.G.
Vol 45, No 5 (2016) Effect of the reflection coefficients on the conductivity of a thin metal layer in the case of an inhomogeneous time-periodic electric field
Utkin A.I., Yushkanov A.A.
Vol 45, No 7 (2016) Efficiency of frequency transformation on MOS transistors with a built-in channel under intensively handicapped radioreception
Zhuravlev D.V., Mushta A.I.
Vol 48, No 8 (2019) Electrical Performance Improvement of Lead-Acid Battery under the Impact of Micro Carbon Additives
Kuzmenko A.P., Grechushnikov E.A., Kharseev V.A., Salnikov A.N.
Vol 45, No 6 (2016) Electrical properties of a TiN/TixAl1 – xOy/TiN memristor device manufactured by magnetron sputtering
Bobylev A.N., Udovichenko S.Y.
Vol 47, No 8 (2018) Electromagnetic and Mechanical Properties of the Nanocomposites of Polyacrylonitrile/Carbon Nanotubes
Kozhitov L.V., Shadrinov A.V., Muratov D.G., Korovin E.Y., Popkova A.V.
Vol 46, No 6 (2017) Electromagnetic Modeling, Technology, and Production of Microwave C3MOSHFET Switches on AlGaN/GaN Heterostructures
Adonin A.S., Evgrafov A.Y., Minnebaev V.M., Ivashchenko N.G., Myakon’kikh A.V., Rogozhin A.E., Rudenko K.V.
Vol 46, No 6 (2017) Electronic Structure of Molecular Switches on Splitters Based on trans-Polyacetylene
Gorbatsevich A.A., Zhuravlev M.N., Kataeva T.S.
Vol 47, No 2 (2018) Electrophysical Parameters and Radiation Spectra of Boron Trichloride Plasma
Murin D.B., Dunaev A.V.
Vol 46, No 2 (2017) Element base of quantum informatics I. Qubits of a quantum computer based on single atoms in optical traps
Ryabtsev I.I., Beterov I.I., Yakshina E.A., Tretyakov D.B., Entin V.M., Neizvestny I.G., Latyshev A.V., Aseev A.L.
Vol 46, No 2 (2017) Element base of quantum informatics II: Quantum communications with single photons
Ryabtsev I.I., Tretyakov D.B., Kolyako A.V., Pleshkov A.S., Entin V.M., Neizvestny I.G., Latyshev A.V., Aseev A.L.
Vol 46, No 4 (2017) Erratum to: “Influence of external conditions on physical processes and plasma parameters in a model of a high-frequency hybrid plasma system”
Aleksandrov A.F., Petrov A.K., Vavilin K.V., Kral’kina E.A., Neklyudova P.A., Nikonov A.M., Pavlov V.B., Airapetov A.A., Odinokov V.V., Pavlov G.Y., Sologub V.A.
Vol 46, No 4 (2017) Erratum to: “Thin film negative electrode based on silicon composite for lithium-ion batteries”
Airapetov A.A., Vasiliev S.V., Kulova T.L., Lebedev M.E., Metlitskaya A.V., Mironenko A.A., Nikol’skaya N.F., Odinokov V.V., Pavlov G.Y., Pukhov D.E., Rudyi A.S., Skundin A.M., Sologub V.A., Fedorov I.S., Churilov A.B.
Vol 46, No 4 (2017) Erratum to: “Thin-film positive electrode based on vanadium oxides for lithium-ion accumulators”
Vasil’ev S.V., Gerashchenko V.N., Kulova T.L., Lebedev M.E., Mazaletskii L.A., Metlitskaya A.V., Mironenko A.A., Moskovskii S.B., Nikol’skaya N.F., Pukhov D.E., Rudyi A.S., Skundin A.M., Sologub V.A., Fedorov I.S., Churilov A.B.
Vol 48, No 6 (2019) Estimating the Electric Mode Effect (Active and Passive) on the Dose of Radiation Resistance of Microcircuits
Kalashnikov O.A.
Vol 48, No 4 (2019) Estimating the Interrelation between the Rate of Atomic Layer Deposition of Thin Platinum-Group Metal Films and the Molecular Mass of Reactant Precursors
Vasilyev V.Y.
Vol 47, No 6 (2018) Etching of GaAs in the Plasma of a Freon R-12–Argon (CCl2F2/Ar) Mixture
Murin D.B., Dunaev A.V.
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