Browse Title Index

Issue Title File
Vol 52, No 11 (2018) Radiation Resistance of Terahertz Diodes Based on GaAs/AlAs Superlattices
Pavelyev D.G., Vasilev A.P., Kozlov V.A., Obolenskaya E.S.
Vol 50, No 6 (2016) Radiation-induced bistable centers with deep levels in silicon n+p structures
Lastovskii S.B., Markevich V.P., Yakushevich H.S., Murin L.I., Krylov V.P.
Vol 52, No 13 (2018) Radiation-Induced Damage of Silicon-Carbide Diodes by High-Energy Particles
Strel’chuk A.M., Kozlovski V.V., Lebedev A.A.
Vol 51, No 12 (2017) Radiation-produced defects in germanium: Experimental data and models of defects
Emtsev V.V., Kozlovski V.V., Poloskin D.S., Oganesyan G.A.
Vol 50, No 5 (2016) Radiation-stimulated processes in transistor temperature sensors
Pavlyk B.V., Grypa A.S.
Vol 51, No 3 (2017) Radiative d–d transitions at tungsten centers in II–VI semiconductors
Ushakov V.V., Krivobok V.S., Pruchkina A.A.
Vol 52, No 7 (2018) Radiative Recombination, Carrier Capture at Traps, and Photocurrent Relaxation in PbSnTe:In with a Composition Close to Band Inversion
Ishchenko D.V., Neizvestny I.G.
Vol 53, No 11 (2019) Raman Scattering in AlN Crystals Grown by Sublimation on SiC and AlN Seeds
Breev I.D., Anisimov A.N., Wolfson A.A., Kazarova O.P., Mokhov E.N.
Vol 51, No 2 (2017) Raman scattering in InP doped by Be+-ion implantation
Avakyants L.P., Bokov P.Y., Chervyakov A.V.
Vol 53, No 4 (2019) Raman Scattering in InSb Spherical Nanocrystals Ion-Synthesized in Silicon-Oxide Films
Tyschenko I.E., Volodin V.A., Popov V.P.
Vol 52, No 9 (2018) Raman Spectra of Thick Epitaxial GaN Layers Formed on SiC by the Sublimation Sandwich Method
Anisimov A.N., Wolfson A.A., Mokhov E.N.
Vol 52, No 6 (2018) Rb1 – xCsxNO3 (x = 0.025, 0.05, 0.1) Single Crystals and Their High-Temperature X-Ray Study
Haziyeva A.F., Nasirov V.I., Asadov Y.G., Aliyev Y.I., Jabarov S.H.
Vol 52, No 10 (2018) Recombination in GaAs pin Structures with InGaAs Quantum-Confined Objects: Modeling and Regularities
Mintairov M.A., Evstropov V.V., Mintairov S.A., Salii R.A., Shvarts M.Z., Kalyuzhnyy N.A.
Vol 53, No 12 (2019) Recombination of Mobile Carriers Across Boron Excited Levels in Silicon at Low Temperatures
Muratov T.T.
Vol 53, No 14 (2019) Record Low Threshold Current Density in Quantum Dot Microdisk Laser
Moiseev E.I., Kryzhanovskaya N.V., Zubov F.I., Mikhailovskii M.S., Abramov A.N., Maximov M.V., Kulagina M.M., Guseva Y.A., Livshits D.A., Zhukov A.E.
Vol 52, No 4 (2018) Red Single-Photon Emission from InAs/AlGaAs Quantum Dots
Rakhlin M.V., Belyaev K.G., Klimko G.V., Mukhin I.S., Ivanov S.V., Toropov A.A.
Vol 52, No 13 (2018) Redistribution of Erbium and Oxygen Recoil Atoms and the Structure of Silicon Thin Surface Layers Formed by High-Dose Argon Implantation through Er and SiO2 Surface Films
Feklistov K.V., Cherkov A.G., Popov V.P., Fedina L.I.
Vol 52, No 11 (2018) Reduction of Internal Loss and Thermal Resistance in Diode Lasers with Coupled Waveguides
Zhukov A.E., Gordeev N.Y., Shernyakov Y.M., Payusov A.S., Serin A.A., Kulagina M.M., Mintairov S.A., Kalyuzhnyy N.A., Maximov M.V.
Vol 50, No 10 (2016) Reflectance of a PbSb2Te4 crystal in a wide spectral range
Nemov S.A., Ulashkevich Y.V., Povolotskii A.V., Khlamov I.I.
Vol 51, No 10 (2017) Reflectance spectra of p-Bi2Te3:Sn crystals in a wide IR region
Nemov S.A., Ulashkevich Y.V., Allahkhah A.A.
Vol 52, No 16 (2018) Reflectometry of X-ray Whispering Gallery Waves Propagating along Liquid Meniscuses
Goray L.I., Asadchikov V.E., Roshchin B.S., Volkov Y.O., Tikhonov A.M.
Vol 52, No 12 (2018) Relation between the Electronic Properties and Structure of InAs/GaAs Quantum Dots Grown by Vapor-Phase Epitaxy
Gorshkov A.P., Volkova N.S., Pavlov D.A., Usov Y.V., Istomin L.A., Levichev S.B.
Vol 53, No 11 (2019) Relation between the Relaxation of Intrinsic Stimulated Picosecond Emission from GaAs with a Characteristic Charge-Carrier Cooling Time
Ageeva N.N., Bronevoi I.L., Zabegaev D.N., Krivonosov A.N.
Vol 50, No 9 (2016) Relation between the structural and phase transformations in titanium-oxide films and the electrical and photoelectric properties of TiO2–Si structures
Kalygina V.M., Egorova I.M., Novikov V.A., Prudaev I.A., Tolbanov O.P.
Vol 50, No 4 (2016) Relaxation oscillations of superluminescence in a semiconductor caused by recovery of the Fermi distribution of nonequilibrium electrons
Kumekov S.E., Mustafin A.T., Mussatay S.S.
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