Author Details

Volodin, V. A.

Issue Section Title File
Vol 50, No 7 (2016) Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena Optical properties of p–i–n structures based on amorphous hydrogenated silicon with silicon nanocrystals formed via nanosecond laser annealing
Vol 51, No 9 (2017) Fabrication, Treatment, and Testing of Materials and Structures Specific features of the ion-beam synthesis of Ge nanocrystals in SiO2 thin films
Vol 51, No 10 (2017) Fabrication, Treatment, and Testing of Materials and Structures Formation and study of p–i–n structures based on two-phase hydrogenated silicon with a germanium layer in the i-type region
Vol 52, No 2 (2018) Fabrication, Treatment, and Testing of Materials and Structures Ion-Beam Synthesis of the Crystalline Ge Phase in SiOxNy Films upon Annealing under High Pressure
Vol 52, No 5 (2018) XXV International Symposium “Nanostructures: Physics and Technology”, Saint Petersburg, Russia, June 26–30, 2017. Nanostructure Technology New Method of Porous Ge Layer Fabrication: Structure and Optical Properties
Vol 52, No 6 (2018) Spectroscopy, Interaction with Radiation Forbidden Resonant Raman Scattering in GaAs/AlAs Superlattices: Experiment and Calculations
Vol 52, No 9 (2018) Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors On the Formation of IR-Light-Emitting Ge Nanocrystals in Ge:SiO2 Films
Vol 53, No 3 (2019) Fabrication, Treatment, and Testing of Materials and Structures Crystallization of Amorphous Germanium Films and Multilayer a-Ge/a-Si Structures upon Exposure to Nanosecond Laser Radiation
Vol 53, No 4 (2019) Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors Raman Scattering in InSb Spherical Nanocrystals Ion-Synthesized in Silicon-Oxide Films
Vol 53, No 11 (2019) Spectroscopy, Interaction with Radiation Luminescence Properties of FZ Silicon Irradiated with Swift Heavy Ions
Vol 53, No 16 (2019) Nanostructures Technology Study of Structural Modification of Composites with Ge Nanoclusters by Optical and Electron Microscopy Methods

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