Author Details

Vasil’ev, A.

Issue Section Title File
Vol 50, No 10 (2016) Physics of Semiconductor Devices Polarization characteristics of 850-nm vertical-cavity surface-emitting lasers with intracavity contacts and a rhomboidal oxide current aperture
Vol 51, No 3 (2017) Electronic Properties of Semiconductors Effect of the energy of bombarding electrons on the conductivity of n-4H-SiC (CVD) epitaxial layers
Vol 51, No 11 (2017) XXI International Symposium “Nanophysics and Nanoelectronics”, Nizhny Novgorod, March 13–16, 2017 Molecular-beam epitaxy of InGaAs/InAlAs/AlAs structures for heterobarrier varactors
Vol 52, No 1 (2018) Physics of Semiconductor Devices Emission-Line Width and α-Factor of 850-nm Single-Mode Vertical-Cavity Surface-Emitting Lasers Based on InGaAs/AlGaAs Quantum Wells
Vol 52, No 3 (2018) Electronic Properties of Semiconductors Formation of Radiation Defects by Proton Braking in Lightly Doped n- and p-SiC Layers
Vol 52, No 4 (2018) XXV International Symposium “Nanostructures: Physics and Technology”, Saint Petersburg, June 26–30, 2017. Optoelectronics, Optical Properties Optical Properties of AlGaAs/GaAs Resonant Bragg Structure at the Second Quantum State
Vol 52, No 10 (2018) Physics of Semiconductor Devices Effect of Epitaxial-Structure Design and Growth Parameters on the Characteristics of Metamorphic Lasers of the 1.46-μm Optical Range Based on Quantum Dots Grown on GaAs Substrates
Vol 53, No 5 (2019) XVI International Conference  “thermoelectrics and Their Applications–2018” (Iscta 2018,) St. Petersburg, October 8–12, 2018 Thermoelectric Properties of Bi2 –xLuxTe2.7Se0.3 Solid Solutions
Vol 53, No 13 (2019) Thermoelectrics and Their Applications Effect of Spark Plasma Sintering Temperature on Thermoelectric Properties of Grained Bi1.9Gd0.1Te3 Compound

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