作者的详细信息
Orlov, V. I.
| 期 | 栏目 | 标题 | 文件 |
| 卷 53, 编号 1 (2019) | Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors | Dependence of the Bulk Electrical Properties of Multisilicon on the Grain Misorientation Parameters | |
| 卷 53, 编号 4 (2019) | Nonelectronic Properties of Semiconductors (Atomic Structure, Diffusion) | Effect of Nickel and Copper Introduced at Room Temperature on the Recombination Properties of Extended Defects in Silicon |