Informaçao sobre o Autor
Orlov, V. I.
| Edição | Seção | Título | Arquivo |
| Volume 53, Nº 1 (2019) | Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors | Dependence of the Bulk Electrical Properties of Multisilicon on the Grain Misorientation Parameters | |
| Volume 53, Nº 4 (2019) | Nonelectronic Properties of Semiconductors (Atomic Structure, Diffusion) | Effect of Nickel and Copper Introduced at Room Temperature on the Recombination Properties of Extended Defects in Silicon |