Информация об авторе
Orlov, V. I.
| Выпуск | Раздел | Название | Файл |
| Том 53, № 1 (2019) | Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors | Dependence of the Bulk Electrical Properties of Multisilicon on the Grain Misorientation Parameters | |
| Том 53, № 4 (2019) | Nonelectronic Properties of Semiconductors (Atomic Structure, Diffusion) | Effect of Nickel and Copper Introduced at Room Temperature on the Recombination Properties of Extended Defects in Silicon |