Автор туралы ақпарат
Yakimov, E. B.
| Шығарылым | Бөлім | Атауы | Файл |
| Том 52, № 2 (2018) | Fabrication, Treatment, and Testing of Materials and Structures | Electrical Activity of Extended Defects in Multicrystalline Silicon | |
| Том 53, № 1 (2019) | Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors | Dependence of the Bulk Electrical Properties of Multisilicon on the Grain Misorientation Parameters | |
| Том 53, № 1 (2019) | Physics of Semiconductor Devices | Simulation of the Parameters of a Titanium-Tritide-Based Beta-Voltaic Cell | |
| Том 53, № 2 (2019) | Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors | Thermoresistive Semiconductor SiC/Si Composite Material | |
| Том 53, № 4 (2019) | Nonelectronic Properties of Semiconductors (Atomic Structure, Diffusion) | Effect of Nickel and Copper Introduced at Room Temperature on the Recombination Properties of Extended Defects in Silicon |