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Vol 53, No 11 (2019)
Determination of the Free Charge Carrier Concentration in Boron-Doped Silicon Nanowires Using Attenuated Total Reflection Infrared Spectroscopy
Lipkova E.A., Efimova A.I., Gonchar K.A., Presnov D.E., Eliseev A.A., Lapshin A.N., Timoshenko V.Y.
PDF
(Eng)
Vol 52, No 11 (2018)
Plasma Chemical Etching of Gallium Arsenide in C2F5Cl-Based Inductively Coupled Plasma
Okhapkin A.I., Yunin P.A., Drozdov M.N., Kraev S.A., Skorokhodov E.V., Shashkin V.I.
PDF
(Eng)
Vol 52, No 11 (2018)
Formation and Properties of Locally Tensile Strained Ge Microstructures for Silicon Photonics
Novikov A.V., Yurasov D.V., Morozova E.E., Skorohodov E.V., Verbus V.A., Yablonskiy A.N., Baidakova N.A., Gusev N.S., Kudryavtsev K.E., Nezhdanov A.V., Mashin A.I.
PDF
(Eng)
Vol 50, No 13 (2016)
Effect of ionic Ag+ transfer on localization of metal-assisted etching of silicon surface
Pyatilova O.V., Sysa A.V., Gavrilov S.A., Yakimova L.V., Pavlov A.A., Belov A.N., Raskin A.A.
PDF
(Eng)
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