Measurement Techniques
ISSN 0543-1972 (Print)
ISSN 1573-8906 (Online)
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Keywords
accelerometer
calibration
comparator
concentration
diagnostics
frequency instability
laser
laser beam
laser radiation
magnetic field
mathematical model
metrological characteristics
nondestructive testing
photodetector
primary standard
sensitivity
sensor
spectrum
standard
uncertainty
verification
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Keywords
accelerometer
calibration
comparator
concentration
diagnostics
frequency instability
laser
laser beam
laser radiation
magnetic field
mathematical model
metrological characteristics
nondestructive testing
photodetector
primary standard
sensitivity
sensor
spectrum
standard
uncertainty
verification
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For Librarians
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Author Details
Author Details
Todua, P. A.
Issue
Section
Title
File
Vol 59, No 8 (2016)
Nanometrology
Experimental Study of Three-Dimensional Reconstruction of Relief Structures from Stereo Images Obtained in a Scanning Electron Microscope
Vol 59, No 8 (2016)
Article
Measurement of the Thickness Nonuniformity of Nanofilms Using an Electron Probe Method
Vol 59, No 2 (2016)
Physicochemical Measurements
Measurement of Structural Parameters Based on X-Ray Emission Spectra with Energy-Dispersive Detection
Vol 59, No 3 (2016)
Article
Analysis of Factors Affecting the Accuracy of Three-Dimensional Reconstruction of the Surface of Objects with Submicrometer Relief Obtained by Scanning Electron Microscope Stereo Images
Vol 59, No 10 (2017)
Nanometrology
Thermal Effects During Low-Voltage Electron-Probe X-Ray Spectral Microanalysis with Nanometer Localization
Vol 59, No 11 (2017)
Physicochemical Measurements
Change in the Chemical Composition of an Analyzed Object During Low-Voltage Electron Probe X-Ray Spectral Microanalysis
Vol 59, No 12 (2017)
Article
Calibration of Scanning Electron Microscopes over a Wide Range of Magnifications
Vol 60, No 3 (2017)
Article
Measurement of the Height of Nanorelief Elements by the Method of Three-Dimensional Reconstruction in a Scanning Electron Microscope
Vol 60, No 6 (2017)
Nanometrology
Thermal Action of an Electronic Probe with X-ray Spectral Nanoanalysis
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