Measurement of Structural Parameters Based on X-Ray Emission Spectra with Energy-Dispersive Detection


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Abstract

The feasibility of using the diffraction peaks in x-ray emission spectra detected with energy dispersion for measuring the spacing between lattice planes in crystalline substances is demonstrated.

About the authors

V. P. Gavrilenko

Research Center for the Study of the Properties of Surfaces and Vacuum (NITsPV)

Author for correspondence.
Email: fgupnicpv@mail.ru
Russian Federation, Moscow

A. V. Zablotskii

Research Center for the Study of the Properties of Surfaces and Vacuum (NITsPV); Moscow Institute of Physics and Technology (MFTI)

Email: fgupnicpv@mail.ru
Russian Federation, Moscow; Dolgoprudnyi, Moscow Region

S. A. Korneichuk

Systems for Microscopy and Analysis

Email: fgupnicpv@mail.ru
Russian Federation, Moscow

A. Yu. Kuzin

Research Center for the Study of the Properties of Surfaces and Vacuum (NITsPV)

Email: fgupnicpv@mail.ru
Russian Federation, Moscow

T. A. Kupriyanova

Institute of General and Inorganic Chemistry, Russian Academy of Sciences (IONKh RAN)

Email: fgupnicpv@mail.ru
Russian Federation, Moscow

O. I. Lyamina

Institute of General and Inorganic Chemistry, Russian Academy of Sciences (IONKh RAN)

Email: fgupnicpv@mail.ru
Russian Federation, Moscow

P. A. Todua

Research Center for the Study of the Properties of Surfaces and Vacuum (NITsPV); Moscow Institute of Physics and Technology (MFTI)

Email: fgupnicpv@mail.ru
Russian Federation, Moscow; Dolgoprudnyi, Moscow Region

M. N. Filippov

Research Center for the Study of the Properties of Surfaces and Vacuum (NITsPV); Institute of General and Inorganic Chemistry, Russian Academy of Sciences (IONKh RAN)

Email: fgupnicpv@mail.ru
Russian Federation, Moscow; Moscow

V. Ya. Shklover

Systems for Microscopy and Analysis

Email: fgupnicpv@mail.ru
Russian Federation, Moscow


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