Analysis of Factors Affecting the Accuracy of Three-Dimensional Reconstruction of the Surface of Objects with Submicrometer Relief Obtained by Scanning Electron Microscope Stereo Images


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We present analysis results of factors influencing the systematic error in 3-D reconstruction of surface reliefs based on stereo images obtained using the scanning electron microscope S-4800. The typical size for the surface relief elements is less than 1 μm. The main sources of the error are found. It is shown that for typical samples the main factor influencing the systematic error of 3-D reconstruction is the parallax measurement error.

作者简介

A. Kuzin

All-Russia Research Institute of Metrological Service (VNIIMS)

Email: fgupnicpv@mail.ru
俄罗斯联邦, Moscow

A. Vasil’ev

National Research Center Kurchatov Institute; Institute of Crystallography, Russian Academy of Sciences

Email: fgupnicpv@mail.ru
俄罗斯联邦, Moscow; Moscow

V. Mityukhlyaev

Research Center for the Study of the Properties of Surfaces and Vacuum (NITsPV)

Email: fgupnicpv@mail.ru
俄罗斯联邦, Moscow

A. Mikhutkin

National Research Center Kurchatov Institute

Email: fgupnicpv@mail.ru
俄罗斯联邦, Moscow

P. Todua

Research Center for the Study of the Properties of Surfaces and Vacuum (NITsPV); Moscow Institute of Physics and Technology (State University)

编辑信件的主要联系方式.
Email: fgupnicpv@mail.ru
俄罗斯联邦, Moscow; Dolgoprudny, Moscow Oblast

M. Filippov

Research Center for the Study of the Properties of Surfaces and Vacuum (NITsPV); Moscow Institute of Physics and Technology (State University)

Email: fgupnicpv@mail.ru
俄罗斯联邦, Moscow; Dolgoprudny, Moscow Oblast

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