Автор туралы ақпарат

Todua, P. A.

Шығарылым	Бөлім	Атауы	Файл
Том 59, № 8 (2016)	Nanometrology	Experimental Study of Three-Dimensional Reconstruction of Relief Structures from Stereo Images Obtained in a Scanning Electron Microscope
Том 59, № 8 (2016)	Article	Measurement of the Thickness Nonuniformity of Nanofilms Using an Electron Probe Method
Том 59, № 2 (2016)	Physicochemical Measurements	Measurement of Structural Parameters Based on X-Ray Emission Spectra with Energy-Dispersive Detection
Том 59, № 3 (2016)	Article	Analysis of Factors Affecting the Accuracy of Three-Dimensional Reconstruction of the Surface of Objects with Submicrometer Relief Obtained by Scanning Electron Microscope Stereo Images
Том 59, № 10 (2017)	Nanometrology	Thermal Effects During Low-Voltage Electron-Probe X-Ray Spectral Microanalysis with Nanometer Localization
Том 59, № 11 (2017)	Physicochemical Measurements	Change in the Chemical Composition of an Analyzed Object During Low-Voltage Electron Probe X-Ray Spectral Microanalysis
Том 59, № 12 (2017)	Article	Calibration of Scanning Electron Microscopes over a Wide Range of Magnifications
Том 60, № 3 (2017)	Article	Measurement of the Height of Nanorelief Elements by the Method of Three-Dimensional Reconstruction in a Scanning Electron Microscope
Том 60, № 6 (2017)	Nanometrology	Thermal Action of an Electronic Probe with X-ray Spectral Nanoanalysis