Информация об авторе

Yakimov, E.

Выпуск	Раздел	Название	Файл
Том 52, № 2 (2018)	Fabrication, Treatment, and Testing of Materials and Structures	Electrical Activity of Extended Defects in Multicrystalline Silicon
Том 53, № 1 (2019)	Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors	Dependence of the Bulk Electrical Properties of Multisilicon on the Grain Misorientation Parameters
Том 53, № 1 (2019)	Physics of Semiconductor Devices	Simulation of the Parameters of a Titanium-Tritide-Based Beta-Voltaic Cell
Том 53, № 2 (2019)	Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors	Thermoresistive Semiconductor SiC/Si Composite Material
Том 53, № 4 (2019)	Nonelectronic Properties of Semiconductors (Atomic Structure, Diffusion)	Effect of Nickel and Copper Introduced at Room Temperature on the Recombination Properties of Extended Defects in Silicon
Том 53, № 8 (2019)	Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena	Dependence of the Spontaneous Luminescence Intensity in ZnO Nanorods on their Length