Отправить статью по E-mail The Features of GaAs Nanowire SEM Images
- Авторы: Soshnikov I.1,2,3, Kotlyar K.1,4, Bert N.2, Kirilenko D.2,5, Bouravleuv A.1,2,3, Cirlin G.1,2,3,4
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Учреждения:
- St. Petersburg Academic University Russian Academy of Sciences
- Ioffe Institute
- Institute for Analytical Instrumentation Russian Academy of Sciences
- St. Petersburg State University
- ITMO University
- Выпуск: Том 52, № 5 (2018)
- Страницы: 605-608
- Раздел: XXV International Symposium “Nanostructures: Physics and Technology”, Saint Petersburg, Russia, June 26–30, 2017. Nanostructure Characterization
- URL: https://journals.rcsi.science/1063-7826/article/view/203142
- DOI: https://doi.org/10.1134/S1063782618050317
- ID: 203142
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Аннотация
The detailed study of GaAs nanowires synthesized by molecular beam epitaxy performed by scanning electron microscopy allowed to reveal the presence of specific contrast in the images obtained. To understand the causes of the phenomenon the transmission electron microscopy of nanowire crystal structure was carried out. The results showed that it could be caused by the segments having polytypic crystal phase. It was also confirmed by the modelling of the electron beam scattering on such nanowire arrays.
Об авторах
I. Soshnikov
St. Petersburg Academic University Russian Academy of Sciences; Ioffe Institute; Institute for Analytical Instrumentation Russian Academy of Sciences
Автор, ответственный за переписку.
Email: ipsosh@beam.ioffe.ru
Россия, St. Petersburg, 194021; St. Petersburg, 194021; St. Petersburg, 190103
K. Kotlyar
St. Petersburg Academic University Russian Academy of Sciences; St. Petersburg State University
Email: ipsosh@beam.ioffe.ru
Россия, St. Petersburg, 194021; St. Petersburg, 199034
N. Bert
Ioffe Institute
Email: ipsosh@beam.ioffe.ru
Россия, St. Petersburg, 194021
D. Kirilenko
Ioffe Institute; ITMO University
Email: ipsosh@beam.ioffe.ru
Россия, St. Petersburg, 194021; St. Petersburg, 197101
A. Bouravleuv
St. Petersburg Academic University Russian Academy of Sciences; Ioffe Institute; Institute for Analytical Instrumentation Russian Academy of Sciences
Email: ipsosh@beam.ioffe.ru
Россия, St. Petersburg, 194021; St. Petersburg, 194021; St. Petersburg, 190103
G. Cirlin
St. Petersburg Academic University Russian Academy of Sciences; Ioffe Institute; Institute for Analytical Instrumentation Russian Academy of Sciences; St. Petersburg State University
Email: ipsosh@beam.ioffe.ru
Россия, St. Petersburg, 194021; St. Petersburg, 194021; St. Petersburg, 190103; St. Petersburg, 199034
