Email this article The Features of GaAs Nanowire SEM Images
- Authors: Soshnikov I.P.1,2,3, Kotlyar K.P.1,4, Bert N.A.2, Kirilenko D.A.2,5, Bouravleuv A.D.1,2,3, Cirlin G.E.1,2,3,4
-
Affiliations:
- St. Petersburg Academic University Russian Academy of Sciences
- Ioffe Institute
- Institute for Analytical Instrumentation Russian Academy of Sciences
- St. Petersburg State University
- ITMO University
- Issue: Vol 52, No 5 (2018)
- Pages: 605-608
- Section: XXV International Symposium “Nanostructures: Physics and Technology”, Saint Petersburg, Russia, June 26–30, 2017. Nanostructure Characterization
- URL: https://journals.rcsi.science/1063-7826/article/view/203142
- DOI: https://doi.org/10.1134/S1063782618050317
- ID: 203142
Cite item
Open Access
Access granted
Subscription Access
Abstract
The detailed study of GaAs nanowires synthesized by molecular beam epitaxy performed by scanning electron microscopy allowed to reveal the presence of specific contrast in the images obtained. To understand the causes of the phenomenon the transmission electron microscopy of nanowire crystal structure was carried out. The results showed that it could be caused by the segments having polytypic crystal phase. It was also confirmed by the modelling of the electron beam scattering on such nanowire arrays.
About the authors
I. P. Soshnikov
St. Petersburg Academic University Russian Academy of Sciences; Ioffe Institute; Institute for Analytical Instrumentation Russian Academy of Sciences
Author for correspondence.
Email: ipsosh@beam.ioffe.ru
Russian Federation, St. Petersburg, 194021; St. Petersburg, 194021; St. Petersburg, 190103
K. P. Kotlyar
St. Petersburg Academic University Russian Academy of Sciences; St. Petersburg State University
Email: ipsosh@beam.ioffe.ru
Russian Federation, St. Petersburg, 194021; St. Petersburg, 199034
N. A. Bert
Ioffe Institute
Email: ipsosh@beam.ioffe.ru
Russian Federation, St. Petersburg, 194021
D. A. Kirilenko
Ioffe Institute; ITMO University
Email: ipsosh@beam.ioffe.ru
Russian Federation, St. Petersburg, 194021; St. Petersburg, 197101
A. D. Bouravleuv
St. Petersburg Academic University Russian Academy of Sciences; Ioffe Institute; Institute for Analytical Instrumentation Russian Academy of Sciences
Email: ipsosh@beam.ioffe.ru
Russian Federation, St. Petersburg, 194021; St. Petersburg, 194021; St. Petersburg, 190103
G. E. Cirlin
St. Petersburg Academic University Russian Academy of Sciences; Ioffe Institute; Institute for Analytical Instrumentation Russian Academy of Sciences; St. Petersburg State University
Email: ipsosh@beam.ioffe.ru
Russian Federation, St. Petersburg, 194021; St. Petersburg, 194021; St. Petersburg, 190103; St. Petersburg, 199034
