Мақаланы E-mail арқылы жіберу The Features of GaAs Nanowire SEM Images
- Авторлар: Soshnikov I.1,2,3, Kotlyar K.1,4, Bert N.2, Kirilenko D.2,5, Bouravleuv A.1,2,3, Cirlin G.1,2,3,4
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Мекемелер:
- St. Petersburg Academic University Russian Academy of Sciences
- Ioffe Institute
- Institute for Analytical Instrumentation Russian Academy of Sciences
- St. Petersburg State University
- ITMO University
- Шығарылым: Том 52, № 5 (2018)
- Беттер: 605-608
- Бөлім: XXV International Symposium “Nanostructures: Physics and Technology”, Saint Petersburg, Russia, June 26–30, 2017. Nanostructure Characterization
- URL: https://journals.rcsi.science/1063-7826/article/view/203142
- DOI: https://doi.org/10.1134/S1063782618050317
- ID: 203142
Дәйексөз келтіру
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Рұқсат берілді
Тек жазылушылар үшін
Аннотация
The detailed study of GaAs nanowires synthesized by molecular beam epitaxy performed by scanning electron microscopy allowed to reveal the presence of specific contrast in the images obtained. To understand the causes of the phenomenon the transmission electron microscopy of nanowire crystal structure was carried out. The results showed that it could be caused by the segments having polytypic crystal phase. It was also confirmed by the modelling of the electron beam scattering on such nanowire arrays.
Авторлар туралы
I. Soshnikov
St. Petersburg Academic University Russian Academy of Sciences; Ioffe Institute; Institute for Analytical Instrumentation Russian Academy of Sciences
Хат алмасуға жауапты Автор.
Email: ipsosh@beam.ioffe.ru
Ресей, St. Petersburg, 194021; St. Petersburg, 194021; St. Petersburg, 190103
K. Kotlyar
St. Petersburg Academic University Russian Academy of Sciences; St. Petersburg State University
Email: ipsosh@beam.ioffe.ru
Ресей, St. Petersburg, 194021; St. Petersburg, 199034
N. Bert
Ioffe Institute
Email: ipsosh@beam.ioffe.ru
Ресей, St. Petersburg, 194021
D. Kirilenko
Ioffe Institute; ITMO University
Email: ipsosh@beam.ioffe.ru
Ресей, St. Petersburg, 194021; St. Petersburg, 197101
A. Bouravleuv
St. Petersburg Academic University Russian Academy of Sciences; Ioffe Institute; Institute for Analytical Instrumentation Russian Academy of Sciences
Email: ipsosh@beam.ioffe.ru
Ресей, St. Petersburg, 194021; St. Petersburg, 194021; St. Petersburg, 190103
G. Cirlin
St. Petersburg Academic University Russian Academy of Sciences; Ioffe Institute; Institute for Analytical Instrumentation Russian Academy of Sciences; St. Petersburg State University
Email: ipsosh@beam.ioffe.ru
Ресей, St. Petersburg, 194021; St. Petersburg, 194021; St. Petersburg, 190103; St. Petersburg, 199034
