Spectra of SmS Films in the Far- and Mid-Infrared Regions

Yu. V. Ulashkevich; V. V. Kaminski; S. M. Soloviev; N. V. Sharenkova

doi:10.1134/S1063782619110216

Spectra of SmS Films in the Far- and Mid-Infrared Regions

Autores: Ulashkevich Y.V.¹, Kaminski V.V.¹, Soloviev S.M.¹, Sharenkova N.V.¹
Afiliações:
1. Ioffe Institute
Edição: Volume 53, Nº 11 (2019)
Páginas: 1511-1513
Seção: Amorphous, Vitreous, and Organic Semiconductors
URL: https://journals.rcsi.science/1063-7826/article/view/207308
DOI: https://doi.org/10.1134/S1063782619110216
ID: 207308

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Resumo

The basic features of the band structure observed in bulk samples are retained in polycrystalline SmS thin films. Specifically, the bottom of the conduction band is formed from s-type states and there exist donor impurity levels in the band gap, at an energy of 0.04–0.065 eV below the bottom of the conduction band.