Email this article Spectra of SmS Films in the Far- and Mid-Infrared Regions
- Authors: Ulashkevich Y.V.1, Kaminski V.V.1, Soloviev S.M.1, Sharenkova N.V.1
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Affiliations:
- Ioffe Institute
- Issue: Vol 53, No 11 (2019)
- Pages: 1511-1513
- Section: Amorphous, Vitreous, and Organic Semiconductors
- URL: https://journals.rcsi.science/1063-7826/article/view/207308
- DOI: https://doi.org/10.1134/S1063782619110216
- ID: 207308
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Abstract
The basic features of the band structure observed in bulk samples are retained in polycrystalline SmS thin films. Specifically, the bottom of the conduction band is formed from s-type states and there exist donor impurity levels in the band gap, at an energy of 0.04–0.065 eV below the bottom of the conduction band.
About the authors
Yu. V. Ulashkevich
Ioffe Institute
Email: vladimir.kaminski@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021
V. V. Kaminski
Ioffe Institute
Author for correspondence.
Email: vladimir.kaminski@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021
S. M. Soloviev
Ioffe Institute
Email: vladimir.kaminski@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021
N. V. Sharenkova
Ioffe Institute
Email: vladimir.kaminski@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021
