Spectra of SmS Films in the Far- and Mid-Infrared Regions
- 作者: Ulashkevich Y.1, Kaminski V.1, Soloviev S.1, Sharenkova N.1
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隶属关系:
- Ioffe Institute
- 期: 卷 53, 编号 11 (2019)
- 页面: 1511-1513
- 栏目: Amorphous, Vitreous, and Organic Semiconductors
- URL: https://journals.rcsi.science/1063-7826/article/view/207308
- DOI: https://doi.org/10.1134/S1063782619110216
- ID: 207308
如何引用文章
详细
The basic features of the band structure observed in bulk samples are retained in polycrystalline SmS thin films. Specifically, the bottom of the conduction band is formed from s-type states and there exist donor impurity levels in the band gap, at an energy of 0.04–0.065 eV below the bottom of the conduction band.
作者简介
Yu. Ulashkevich
Ioffe Institute
Email: vladimir.kaminski@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
V. Kaminski
Ioffe Institute
编辑信件的主要联系方式.
Email: vladimir.kaminski@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
S. Soloviev
Ioffe Institute
Email: vladimir.kaminski@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
N. Sharenkova
Ioffe Institute
Email: vladimir.kaminski@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021