Current–voltage characteristics of Schottky diodes at high current densities under the injection of minority carriers


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Resumo

An analytical expression is derived for the current–voltage characteristic of a Schottky diode at a high injection level of minority carriers. It is shown that, even at very high current densities, the higher the base doping level, the larger the voltage drop across the diode. The physical mechanism responsible for this “paradoxical” result is analyzed. The validity of the analytical result is confirmed by a numerical calculation with software that takes into account the whole set of nonlinear effects caused by a high injection level in the base layer and by heavy doping of the emitter region.

Sobre autores

T. Mnatsakanov

All-Russia Electrotechnical Institute

Autor responsável pela correspondência
Email: mnatt@yandex.ru
Rússia, Moscow, 111250

A. Tandoev

All-Russia Electrotechnical Institute

Email: mnatt@yandex.ru
Rússia, Moscow, 111250

M. Levinshtein

Ioffe Institute

Email: mnatt@yandex.ru
Rússia, St. Petersburg, 194021

S. Yurkov

All-Russia Electrotechnical Institute

Email: mnatt@yandex.ru
Rússia, Moscow, 111250

J. Palmour

Wolfspeed

Email: mnatt@yandex.ru
Estados Unidos da América, 3026 East Cornwallis Rd., Research Triangle Park, New York, NC, 27709


Declaração de direitos autorais © Pleiades Publishing, Ltd., 2017

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