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Determining the Hydrogen Concentration from the Photovoltage of Pd–Oxide–InP MIS Structures
Grebenshchikova E.A., Salikhov K.M., Sidorov V.G., Shutaev V.A., Yakovlev Y.P.
Surface Сonductivity Dynamics in PbSnTe:In Films in the Vicinity of a Band Inversion
Klimov A.E., Akimov A.N., Akhundov I.O., Golyashov V.A., Gorshkov D.V., Ishchenko D.V., Sidorov G.Y., Suprun S.P., Tarasov A.S., Epov V.S., Tereshchenko O.E.
Behavioral Features of MIS Memristors with a Si3N4 Nanolayer Fabricated on a Conductive Si Substrate
Tikhov S.V., Gorshkov O.N., Antonov I.N., Tetelbaum D.I., Mikhaylov A.N., Belov A.I., Morozov A.I., Karakolis P., Dimitrakis P.
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