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Semiconductors
ISSN 1063-7826 (Print) ISSN 1090-6479 (Online)
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Keywords GaAs GaAs Substrate GaN Gallium Nitride Sapphire Substrate Versus Characteristic annealing carbon nanotubes doping exciton graphene heterostructure heterostructures luminescence molecular-beam epitaxy photoconductivity photoluminescence quantum dots quantum well silicon thin films
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Keywords GaAs GaAs Substrate GaN Gallium Nitride Sapphire Substrate Versus Characteristic annealing carbon nanotubes doping exciton graphene heterostructure heterostructures luminescence molecular-beam epitaxy photoconductivity photoluminescence quantum dots quantum well silicon thin films
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Author Details

Brunkov, P. N.

Issue Section Title File
Vol 50, No 7 (2016) Fabrication, Treatment, and Testing of Materials and Structures Chloride epitaxy of β-Ga2O3 layers grown on c-sapphire substrates
Vol 52, No 1 (2018) Fabrication, Treatment, and Testing of Materials and Structures Optimization of the Structural Properties and Surface Morphology of a Convex-Graded InxAl1–xAs (x = 0.05–0.83) Metamorphic Buffer Layer Grown via MBE on GaAs (001)
Vol 52, No 5 (2018) XXV International Symposium “Nanostructures: Physics and Technology”, Saint Petersburg, Russia, June 26–30, 2017. Nanostructure Technology Metal-Semiconductor Nanoheterostructures with an AlGaN Quantum Well and In Situ Formed Surface Al Nanoislands
Vol 52, No 13 (2018) Fabrication, Treatment, and Testing of Materials and Structures Features of the Selective Growth of GaN Nanorods on Patterned c-Sapphire Substrates of Various Configurations
Vol 53, No 10 (2019) Surfaces, Interfaces, and Thin Films Molecular-Dynamics Simulation of the Low-Temperature Surface Reconstruction of a GaAs(001) Surface during the Nanoindentation Process
Vol 53, No 11 (2019) Surfaces, Interfaces, and Thin Films Boson Peak Related to Ga Nanoclusters in AlGaN Layers Grown by Plasma-Assisted Molecular Beam Epitaxy at Ga-Rich Conditions
Vol 53, No 16 (2019) Nanostructures Technology The Study of Nanoindentation of Atomically Flat GaAs Surface using the Tip of Atomic-Force Microscope
 

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