| Issue |
Section |
Title |
File |
| Vol 50, No 9 (2016) |
Electronic Properties of Semiconductors |
Electrical parameters of polycrystalline Sm1–xEuxS rare-earth semiconductors |
|
| Vol 51, No 6 (2017) |
Fabrication, Treatment, and Testing of Materials and Structures |
Structural features of Sm1–xEuxS thin polycrystalline films |
|
| Vol 52, No 1 (2018) |
Surfaces, Interfaces, and Thin Films |
Mechanism of the Semiconductor–Metal Phase Transition in Sm1–xGdxS Thin Films |
|
| Vol 52, No 2 (2018) |
Spectroscopy, Interaction with Radiation |
Investigation of the Far-IR Reflection Spectra of SmS Single Crystals and Polycrystals in the Homogeneity Range |
|
| Vol 52, No 4 (2018) |
Article |
Investigation of the Dielectric Permittivity and Electrical Conductivity of Ce2S3 |
|
| Vol 53, No 2 (2019) |
Electronic Properties of Semiconductors |
Features of the Properties of Rare-Earth Semiconductors |
|
| Vol 53, No 6 (2019) |
XVI International Conference “thermoelectrics and Their Applications–2018” (Iscta 2018,) St. Petersburg, October 8–12, 2018 |
On the Structure and Thermoelectric Properties of CoSi Obtained from a Supersaturated Solution–Melt in Sn |
|
| Vol 53, No 11 (2019) |
Amorphous, Vitreous, and Organic Semiconductors |
Spectra of SmS Films in the Far- and Mid-Infrared Regions |
|
