Email this article Structural features of Sm1–xEuxS thin polycrystalline films
- Authors: Kaminskii V.V.1, Solov’ev S.M.1, Khavrov G.D.1, Sharenkova N.V.1, Hirai S.2
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Affiliations:
- Ioffe Institute
- Muroran Institute of Technology
- Issue: Vol 51, No 6 (2017)
- Pages: 828-830
- Section: Fabrication, Treatment, and Testing of Materials and Structures
- URL: https://journals.rcsi.science/1063-7826/article/view/200124
- DOI: https://doi.org/10.1134/S1063782617060124
- ID: 200124
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Abstract
Thin polycrystalline Sm1–xEuxS films (x = 0.1, 0.167, 0.2, 0.25, 0.33, 0.5) were prepared by evaporation of SmS and EuS powders. Structural features of the films were investigated. The influence of Eu concentration and temperature of film deposition on the value of lattice parameter and sizes of X-гау coherent scattering regions was studied. It is shown that formation of Sm1–xEuxS films comes about according to the theory that was previously suggested for SmS films and that the deviation of lattice parameter is explained by the variable valence of samarium ions.
About the authors
V. V. Kaminskii
Ioffe Institute
Author for correspondence.
Email: Vladimir.Kaminski@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021
S. M. Solov’ev
Ioffe Institute
Email: Vladimir.Kaminski@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021
G. D. Khavrov
Ioffe Institute
Email: Vladimir.Kaminski@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021
N. V. Sharenkova
Ioffe Institute
Email: Vladimir.Kaminski@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021
Shinji Hirai
Muroran Institute of Technology
Email: Vladimir.Kaminski@mail.ioffe.ru
Japan, Muroran, Hokkaido, 050-8585
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