Investigation of the Far-IR Reflection Spectra of SmS Single Crystals and Polycrystals in the Homogeneity Range
- Authors: Ulashkevich Y.V.1, Kaminskiy V.V.1, Romanova M.V.1, Sharenkova N.V.1
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Affiliations:
- Ioffe Institute
- Issue: Vol 52, No 2 (2018)
- Pages: 172-176
- Section: Spectroscopy, Interaction with Radiation
- URL: https://journals.rcsi.science/1063-7826/article/view/202394
- DOI: https://doi.org/10.1134/S1063782618020227
- ID: 202394
Cite item
Abstract
The far- and mid-IR reflection spectra of Sm1 + xS (x = 0–0.17) samples are recorded and analyzed, as well as their electrical and structural parameters at a temperature of T = 300 K. The bond ionicity in SmS is shown to fall with a decrease in the area of the X-ray coherent scattering region and an increase in the concentration of donor impurities and, consequently, conduction electron concentration. The electrical conductivity of stoichiometric SmS single crystals and polycrystals can be determined with an error of 10% from the IR reflection spectra. Due to the low structural quality of the samples, the electrical conductivity cannot be determined in the case of deviation from stoichiometry.
About the authors
Yu. V. Ulashkevich
Ioffe Institute
Email: vladimir.kaminski@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021
V. V. Kaminskiy
Ioffe Institute
Author for correspondence.
Email: vladimir.kaminski@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021
M. V. Romanova
Ioffe Institute
Email: vladimir.kaminski@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021
N. V. Sharenkova
Ioffe Institute
Email: vladimir.kaminski@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021