Email this article Setup for Measuring the Thermoelectric Properties of Ultrathin Wires
- Authors: Uryupin O.N.1, Shabaldin A.A.1
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Affiliations:
- Ioffe Institute
- Issue: Vol 53, No 5 (2019)
- Pages: 695-698
- Section: XVI International Conference “thermoelectrics and Their Applications–2018” (Iscta 2018,) St. Petersburg, October 8–12, 2018
- URL: https://journals.rcsi.science/1063-7826/article/view/206193
- DOI: https://doi.org/10.1134/S1063782619050270
- ID: 206193
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Abstract
An experimental setup is developed to measure the thermoelectric properties of semiconductor nanowires with diameters of up to 5 nm in dielectric matrices. This setup makes it possible to measure the electrical resistance and thermoelectric power of nanostructured samples in the temperature range of 77–400 K.
About the authors
O. N. Uryupin
Ioffe Institute
Author for correspondence.
Email: O.uryupin@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021
A. A. Shabaldin
Ioffe Institute
Email: O.uryupin@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021
