电邮这篇文章 Setup for Measuring the Thermoelectric Properties of Ultrathin Wires
- 作者: Uryupin O.1, Shabaldin A.1
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隶属关系:
- Ioffe Institute
- 期: 卷 53, 编号 5 (2019)
- 页面: 695-698
- 栏目: XVI International Conference “thermoelectrics and Their Applications–2018” (Iscta 2018,) St. Petersburg, October 8–12, 2018
- URL: https://journals.rcsi.science/1063-7826/article/view/206193
- DOI: https://doi.org/10.1134/S1063782619050270
- ID: 206193
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详细
An experimental setup is developed to measure the thermoelectric properties of semiconductor nanowires with diameters of up to 5 nm in dielectric matrices. This setup makes it possible to measure the electrical resistance and thermoelectric power of nanostructured samples in the temperature range of 77–400 K.
作者简介
O. Uryupin
Ioffe Institute
编辑信件的主要联系方式.
Email: O.uryupin@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
A. Shabaldin
Ioffe Institute
Email: O.uryupin@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
