Analysis of the Behavior of Nonequilibrium Semiconductor Structures and Microwave Transistors During and After Pulsed γ- and γ-Neutron Irradiation


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Abstract

The influence of nonequilibrium processes in semiconductor structures under the effect of radiation on the characteristics of structures and microwave transistors based on them is analyzed. Special attention is paid to the comparison of pilot (experimental) and series-produced structures and transistors based on them before and after γ-neutron irradiation.

About the authors

M. M. Venediktov

Federal Research and Production Center “Y. Sedakov Research Institute of Measuring Systems”

Author for correspondence.
Email: thelen@yandex.ru
Russian Federation, Nizhny Novgorod, 603137

D. I. Dukov

OAO Research-and-Production Enterprise “Salut”

Email: obolensk@rf.unn.ru
Russian Federation, Nizhny Novgorod, 603152

M. A. Krevskiy

OAO Research-and-Production Enterprise “Salut”

Email: obolensk@rf.unn.ru
Russian Federation, Nizhny Novgorod, 603152

I. O. Metelkin

National Research Nuclear University “MEPhI”

Email: obolensk@rf.unn.ru
Russian Federation, Moscow, 114509

G. V. Chukov

National Research Nuclear University “MEPhI”

Email: obolensk@rf.unn.ru
Russian Federation, Moscow, 114509

V. V. Elesin

National Research Nuclear University “MEPhI”

Email: obolensk@rf.unn.ru
Russian Federation, Moscow, 114509

S. V. Obolensky

Lobachevsky State University of Nizhny Novgorod

Author for correspondence.
Email: obolensk@rf.unn.ru
Russian Federation, Nizhny Novgorod, 603950

A. D. Bozhen’kina

Lobachevsky State University of Nizhny Novgorod

Email: obolensk@rf.unn.ru
Russian Federation, Nizhny Novgorod, 603950

E. A. Tarasova

Lobachevsky State University of Nizhny Novgorod

Email: obolensk@rf.unn.ru
Russian Federation, Nizhny Novgorod, 603950

A. G. Fefelov

OAO Research-and-Production Enterprise “Salut”

Email: obolensk@rf.unn.ru
Russian Federation, Nizhny Novgorod, 603152


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