Investigation of the Optical Properties of Ultrathin Films Based on Metal Silicide
- Autores: Kerimov E.1
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Afiliações:
- Azerbaijan Technical University
- Edição: Volume 52, Nº 2 (2023)
- Páginas: 160-164
- Seção: ТЕХНОЛОГИЯ
- URL: https://journals.rcsi.science/0544-1269/article/view/138497
- DOI: https://doi.org/10.31857/S0544126923700229
- EDN: https://elibrary.ru/PYLCTO
- ID: 138497
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Resumo
When studying the optical properties of thin films, in order to obtain reliable information about the magnitude of their optical constants, it is necessary to accurately measure the thickness of the metal. Thickness 600 < d < 1500 Å is measured by the method of multibeam interferometry and the resonant-frequency method.
Sobre autores
E. Kerimov
Azerbaijan Technical University
Autor responsável pela correspondência
Email: E_Kerimov.fizik@mail.ru
Baku, AZ 1073 Azerbaijan
Bibliografia
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