Effect of Ion-Beam Processing during RF Magnetron Sputtering on the properties of ZnO Films
- 作者: Krylov P.1, Alalykin A.1, Durman E.1, Zakirova R.1, Fedotova I.1
-
隶属关系:
- Udmurt State University
- 期: 卷 53, 编号 11 (2019)
- 页面: 1457-1464
- 栏目: Surfaces, Interfaces, and Thin Films
- URL: https://journals.rcsi.science/1063-7826/article/view/207272
- DOI: https://doi.org/10.1134/S1063782619110095
- ID: 207272
如何引用文章
详细
The effect of ion-beam processing alternating with magnetron sputtering on the properties of zinc-oxide thin films is investigated. It is shown that ion-beam processing reduces the growth rate, coherent-scattering-region sizes, and the resistivity. The stoichiometric index, band gap, and refractive index increase. The transparency of the films in the weak absorption region remains unchanged.
作者简介
P. Krylov
Udmurt State University
编辑信件的主要联系方式.
Email: ftt@udsu.ru
俄罗斯联邦, Izhevsk, 426034
A. Alalykin
Udmurt State University
Email: ftt@udsu.ru
俄罗斯联邦, Izhevsk, 426034
E. Durman
Udmurt State University
Email: ftt@udsu.ru
俄罗斯联邦, Izhevsk, 426034
R. Zakirova
Udmurt State University
Email: ftt@udsu.ru
俄罗斯联邦, Izhevsk, 426034
I. Fedotova
Udmurt State University
Email: ftt@udsu.ru
俄罗斯联邦, Izhevsk, 426034