On the morphology of the interlayer surface and micro-Raman spectra of layered films in topological insulators based on bismuth telluride
- 作者: Lukyanova L.1, Bibik A.2, Aseev V.2, Usov O.1, Makarenko I.1, Petrov V.1, Nikonorov N.2
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隶属关系:
- Ioffe Institute
- St. Petersburg State University of Information Technologies, Mechanics, and Optics
- 期: 卷 51, 编号 6 (2017)
- 页面: 729-731
- 栏目: XV International Conference “Thermoelectrics and Their Applications—2016”, St. Petersburg, November 15–16, 2016
- URL: https://journals.rcsi.science/1063-7826/article/view/200032
- DOI: https://doi.org/10.1134/S1063782617060197
- ID: 200032
如何引用文章
详细
Resonant micro-Raman spectra and the morphology of the interlayer Van der Waals surface are studied for layered thin films of n-Bi2Te3 and solid solutions based on Bi2Te3. It is found that the composition, thickness, surface morphology, and the method of obtaining films affect the relative intensity of Raman phonons, which are sensitive to the topological surface states of Dirac fermions.
作者简介
L. Lukyanova
Ioffe Institute
编辑信件的主要联系方式.
Email: lidia.lukyanova@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
A. Bibik
St. Petersburg State University of Information Technologies, Mechanics, and Optics
Email: lidia.lukyanova@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 197101
V. Aseev
St. Petersburg State University of Information Technologies, Mechanics, and Optics
Email: lidia.lukyanova@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 197101
O. Usov
Ioffe Institute
Email: lidia.lukyanova@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
I. Makarenko
Ioffe Institute
Email: lidia.lukyanova@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
V. Petrov
Ioffe Institute
Email: lidia.lukyanova@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
N. Nikonorov
St. Petersburg State University of Information Technologies, Mechanics, and Optics
Email: lidia.lukyanova@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 197101