On the morphology of the interlayer surface and micro-Raman spectra of layered films in topological insulators based on bismuth telluride
- Авторлар: Lukyanova L.1, Bibik A.2, Aseev V.2, Usov O.1, Makarenko I.1, Petrov V.1, Nikonorov N.2
-
Мекемелер:
- Ioffe Institute
- St. Petersburg State University of Information Technologies, Mechanics, and Optics
- Шығарылым: Том 51, № 6 (2017)
- Беттер: 729-731
- Бөлім: XV International Conference “Thermoelectrics and Their Applications—2016”, St. Petersburg, November 15–16, 2016
- URL: https://journals.rcsi.science/1063-7826/article/view/200032
- DOI: https://doi.org/10.1134/S1063782617060197
- ID: 200032
Дәйексөз келтіру
Аннотация
Resonant micro-Raman spectra and the morphology of the interlayer Van der Waals surface are studied for layered thin films of n-Bi2Te3 and solid solutions based on Bi2Te3. It is found that the composition, thickness, surface morphology, and the method of obtaining films affect the relative intensity of Raman phonons, which are sensitive to the topological surface states of Dirac fermions.
Авторлар туралы
L. Lukyanova
Ioffe Institute
Хат алмасуға жауапты Автор.
Email: lidia.lukyanova@mail.ioffe.ru
Ресей, St. Petersburg, 194021
A. Bibik
St. Petersburg State University of Information Technologies, Mechanics, and Optics
Email: lidia.lukyanova@mail.ioffe.ru
Ресей, St. Petersburg, 197101
V. Aseev
St. Petersburg State University of Information Technologies, Mechanics, and Optics
Email: lidia.lukyanova@mail.ioffe.ru
Ресей, St. Petersburg, 197101
O. Usov
Ioffe Institute
Email: lidia.lukyanova@mail.ioffe.ru
Ресей, St. Petersburg, 194021
I. Makarenko
Ioffe Institute
Email: lidia.lukyanova@mail.ioffe.ru
Ресей, St. Petersburg, 194021
V. Petrov
Ioffe Institute
Email: lidia.lukyanova@mail.ioffe.ru
Ресей, St. Petersburg, 194021
N. Nikonorov
St. Petersburg State University of Information Technologies, Mechanics, and Optics
Email: lidia.lukyanova@mail.ioffe.ru
Ресей, St. Petersburg, 197101