On the morphology of the interlayer surface and micro-Raman spectra of layered films in topological insulators based on bismuth telluride
- Autores: Lukyanova L.1, Bibik A.2, Aseev V.2, Usov O.1, Makarenko I.1, Petrov V.1, Nikonorov N.2
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Afiliações:
- Ioffe Institute
- St. Petersburg State University of Information Technologies, Mechanics, and Optics
- Edição: Volume 51, Nº 6 (2017)
- Páginas: 729-731
- Seção: XV International Conference “Thermoelectrics and Their Applications—2016”, St. Petersburg, November 15–16, 2016
- URL: https://journals.rcsi.science/1063-7826/article/view/200032
- DOI: https://doi.org/10.1134/S1063782617060197
- ID: 200032
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Resumo
Resonant micro-Raman spectra and the morphology of the interlayer Van der Waals surface are studied for layered thin films of n-Bi2Te3 and solid solutions based on Bi2Te3. It is found that the composition, thickness, surface morphology, and the method of obtaining films affect the relative intensity of Raman phonons, which are sensitive to the topological surface states of Dirac fermions.
Sobre autores
L. Lukyanova
Ioffe Institute
Autor responsável pela correspondência
Email: lidia.lukyanova@mail.ioffe.ru
Rússia, St. Petersburg, 194021
A. Bibik
St. Petersburg State University of Information Technologies, Mechanics, and Optics
Email: lidia.lukyanova@mail.ioffe.ru
Rússia, St. Petersburg, 197101
V. Aseev
St. Petersburg State University of Information Technologies, Mechanics, and Optics
Email: lidia.lukyanova@mail.ioffe.ru
Rússia, St. Petersburg, 197101
O. Usov
Ioffe Institute
Email: lidia.lukyanova@mail.ioffe.ru
Rússia, St. Petersburg, 194021
I. Makarenko
Ioffe Institute
Email: lidia.lukyanova@mail.ioffe.ru
Rússia, St. Petersburg, 194021
V. Petrov
Ioffe Institute
Email: lidia.lukyanova@mail.ioffe.ru
Rússia, St. Petersburg, 194021
N. Nikonorov
St. Petersburg State University of Information Technologies, Mechanics, and Optics
Email: lidia.lukyanova@mail.ioffe.ru
Rússia, St. Petersburg, 197101