High-Sensitivity Photodetector Based on Atomically Thin MoS2
- Авторы: Lavrov S.1, Shestakova A.1, Mishina E.1, Efimenkov Y.2, Sigov A.1
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Учреждения:
- Moscow Technological University (MIREA)
- NPP Pulsar
- Выпуск: Том 52, № 6 (2018)
- Страницы: 771-775
- Раздел: Physics of Semiconductor Devices
- URL: https://journals.rcsi.science/1063-7826/article/view/203526
- DOI: https://doi.org/10.1134/S106378261806012X
- ID: 203526
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Аннотация
A design for a high-sensitivity photodetector with a single layer of MoS2 transition-metal dichalcogenide used as the basic functional element is proposed and the process of its fabrication is presented step by step. Quality evaluation and the selection of functional MoS2 flakes is based on the results of combined optical characterization. The main operating characteristics of the fabricated device are investigated and a photosensitivity of 1.4 mA/W is demonstrated. A difference of this device in comparison with existing analogues is its high photosensitivity at low operating voltages (in the range of ±3 V).
Об авторах
S. Lavrov
Moscow Technological University (MIREA)
Автор, ответственный за переписку.
Email: sdlavrov@mail.ru
Россия, Moscow, 119454
A. Shestakova
Moscow Technological University (MIREA)
Email: sdlavrov@mail.ru
Россия, Moscow, 119454
E. Mishina
Moscow Technological University (MIREA)
Email: sdlavrov@mail.ru
Россия, Moscow, 119454
Yu. Efimenkov
NPP Pulsar
Email: sdlavrov@mail.ru
Россия, Moscow, 105187
A. Sigov
Moscow Technological University (MIREA)
Email: sdlavrov@mail.ru
Россия, Moscow, 119454