Photoelectric characteristics of silicon carbide–silicon structures grown by the atomic substitution method in a silicon crystal lattice


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Resumo

Data obtained in an experimental study of the photoelectric characteristics of silicon–silicon carbide structures grown by the atomic substitution method on silicon (100) and (111) substrates are presented. It is found that the maximum sunlight conversion efficiency of a silicon–silicon carbide (silicon carbide–silicon) heterojunction is 5.4%. The theory of dilatation dipole formation upon synthesis by the atomic substitution method is used to account for the mechanism of electrical barrier formation at the silicon–silicon carbide interface.

Sobre autores

A. Grashchenko

Institute of Problems of Mechanical Engineering

Autor responsável pela correspondência
Email: asgrashchenko@bk.ru
Rússia, St. Petersburg, 199178

N. Feoktistov

Institute of Problems of Mechanical Engineering; Ioffe Physical–Technical Institute

Email: asgrashchenko@bk.ru
Rússia, St. Petersburg, 199178; St. Petersburg, 194021

A. Osipov

Institute of Problems of Mechanical Engineering; ITMO University

Email: asgrashchenko@bk.ru
Rússia, St. Petersburg, 199178; St. Petersburg, 197101

E. Kalinina

Ioffe Physical–Technical Institute

Email: asgrashchenko@bk.ru
Rússia, St. Petersburg, 194021

S. Kukushkin

Institute of Problems of Mechanical Engineering; ITMO University; Peter the Great St. Petersburg Polytechnic University

Email: asgrashchenko@bk.ru
Rússia, St. Petersburg, 199178; St. Petersburg, 197101; St. Petersburg, 195251


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