Phosphorus-Based Nanowires Grown by Molecular-Beam Epitaxy on Silicon
- Авторлар: Cirlin G.1,2,3,4, Reznik R.3, Samsonenko Y.1,2, Khrebtov A.1,3, Kotlyar K.1, Ilkiv I.1, Soshnikov I.1,2,4, Kirilenko D.4, Kryzhanovskaya N.1
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Мекемелер:
- St. Petersburg Academic University, Russian Academy of Sciences
- Institute for Analytical Instrumentation, Russian Academy of Sciences
- ITMO University
- Ioffe Institute
- Шығарылым: Том 52, № 11 (2018)
- Беттер: 1416-1419
- Бөлім: Xxii International Symposium “Nanophysics and Nanoelectronics”, Nizhny Novgorod, March 12–15, 2018
- URL: https://journals.rcsi.science/1063-7826/article/view/204317
- DOI: https://doi.org/10.1134/S1063782618110258
- ID: 204317
Дәйексөз келтіру
Аннотация
Data on the growth and physical properties of nanostructures of the type “InAsP insert embedded in InP nanowire (NW)” grown on Si (111) surfaces by Au-assisted molecular-beam epitaxy are presented. It is found that nearly 100%-coherent NWs can be grown with a widely varying surface density. A relationship between the optical and structural properties of the NWs is revealed. It is shown that the NWs under study are formed of a purely wurtzite phase. The suggested technology opens up new opportunities for the integration of direct-gap III–V materials and silicon.
Авторлар туралы
G. Cirlin
St. Petersburg Academic University, Russian Academy of Sciences; Institute for Analytical Instrumentation, Russian Academy of Sciences; ITMO University; Ioffe Institute
Хат алмасуға жауапты Автор.
Email: cirlin@beam.ioffe.ru
Ресей, St. Petersburg, 194021; St. Petersburg, 190103; St. Petersburg, 197101; St. Petersburg, 194021
R. Reznik
ITMO University
Email: cirlin@beam.ioffe.ru
Ресей, St. Petersburg, 197101
Yu. Samsonenko
St. Petersburg Academic University, Russian Academy of Sciences; Institute for Analytical Instrumentation, Russian Academy of Sciences
Email: cirlin@beam.ioffe.ru
Ресей, St. Petersburg, 194021; St. Petersburg, 190103
A. Khrebtov
St. Petersburg Academic University, Russian Academy of Sciences; ITMO University
Email: cirlin@beam.ioffe.ru
Ресей, St. Petersburg, 194021; St. Petersburg, 197101
K. Kotlyar
St. Petersburg Academic University, Russian Academy of Sciences
Email: cirlin@beam.ioffe.ru
Ресей, St. Petersburg, 194021
I. Ilkiv
St. Petersburg Academic University, Russian Academy of Sciences
Email: cirlin@beam.ioffe.ru
Ресей, St. Petersburg, 194021
I. Soshnikov
St. Petersburg Academic University, Russian Academy of Sciences; Institute for Analytical Instrumentation, Russian Academy of Sciences; Ioffe Institute
Email: cirlin@beam.ioffe.ru
Ресей, St. Petersburg, 194021; St. Petersburg, 190103; St. Petersburg, 194021
D. Kirilenko
Ioffe Institute
Email: cirlin@beam.ioffe.ru
Ресей, St. Petersburg, 194021
N. Kryzhanovskaya
St. Petersburg Academic University, Russian Academy of Sciences
Email: cirlin@beam.ioffe.ru
Ресей, St. Petersburg, 194021