Dependence of the surface morphology of ultrathin bismuth films on mica substrates on the film thickness
- Authors: Krushelnitckii A.N.1, Demidov E.V.1, Ivanova E.K.1, Kablukova N.S.1, Komarov V.A.1
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Affiliations:
- Herzen State Pedagogical University of Russia
- Issue: Vol 51, No 7 (2017)
- Pages: 876-878
- Section: XV International Conference “Thermoelectrics and Their Applications—2016”, St. Petersburg, November 15–16, 2016
- URL: https://journals.rcsi.science/1063-7826/article/view/200232
- DOI: https://doi.org/10.1134/S1063782617070211
- ID: 200232
Cite item
Abstract
The results of studying the surface of 15- to 100-nm-thick bismuth films by atomic-force microscopy are reported. The near-linear character of the dependences of the average surface roughness and the average height of growth patterns on the film thickness is established. It is found that the average crystallite size increases, as the film thickness is increased. A slight dependence of the crystallite size on the film thickness is observed at thicknesses in the range of 27–70 nm.
About the authors
A. N. Krushelnitckii
Herzen State Pedagogical University of Russia
Email: va-komar@yandex.ru
Russian Federation, St. Petersburg, 191186
E. V. Demidov
Herzen State Pedagogical University of Russia
Email: va-komar@yandex.ru
Russian Federation, St. Petersburg, 191186
E. K. Ivanova
Herzen State Pedagogical University of Russia
Email: va-komar@yandex.ru
Russian Federation, St. Petersburg, 191186
N. S. Kablukova
Herzen State Pedagogical University of Russia
Email: va-komar@yandex.ru
Russian Federation, St. Petersburg, 191186
V. A. Komarov
Herzen State Pedagogical University of Russia
Author for correspondence.
Email: va-komar@yandex.ru
Russian Federation, St. Petersburg, 191186