Dependence of the surface morphology of ultrathin bismuth films on mica substrates on the film thickness
- 作者: Krushelnitckii A.1, Demidov E.1, Ivanova E.1, Kablukova N.1, Komarov V.1
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隶属关系:
- Herzen State Pedagogical University of Russia
- 期: 卷 51, 编号 7 (2017)
- 页面: 876-878
- 栏目: XV International Conference “Thermoelectrics and Their Applications—2016”, St. Petersburg, November 15–16, 2016
- URL: https://journals.rcsi.science/1063-7826/article/view/200232
- DOI: https://doi.org/10.1134/S1063782617070211
- ID: 200232
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详细
The results of studying the surface of 15- to 100-nm-thick bismuth films by atomic-force microscopy are reported. The near-linear character of the dependences of the average surface roughness and the average height of growth patterns on the film thickness is established. It is found that the average crystallite size increases, as the film thickness is increased. A slight dependence of the crystallite size on the film thickness is observed at thicknesses in the range of 27–70 nm.
作者简介
A. Krushelnitckii
Herzen State Pedagogical University of Russia
Email: va-komar@yandex.ru
俄罗斯联邦, St. Petersburg, 191186
E. Demidov
Herzen State Pedagogical University of Russia
Email: va-komar@yandex.ru
俄罗斯联邦, St. Petersburg, 191186
E. Ivanova
Herzen State Pedagogical University of Russia
Email: va-komar@yandex.ru
俄罗斯联邦, St. Petersburg, 191186
N. Kablukova
Herzen State Pedagogical University of Russia
Email: va-komar@yandex.ru
俄罗斯联邦, St. Petersburg, 191186
V. Komarov
Herzen State Pedagogical University of Russia
编辑信件的主要联系方式.
Email: va-komar@yandex.ru
俄罗斯联邦, St. Petersburg, 191186