Author Details

Osipov, A. V.

Issue Section Title File
Vol 50, No 10 (2016) Surfaces, Interfaces, and Thin Films The C 1s core level spectroscopy of carbon atoms at the surface SiC/Si(111)-4° layer and Cs/SiC/Si(111)-4° interface
Vol 51, No 3 (2017) Fabrication, Treatment, and Testing of Materials and Structures Separation of III–N/SiC epitaxial heterostructure from a Si substrate and their transfer to other substrate types
Vol 51, No 5 (2017) Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena Photoelectric characteristics of silicon carbide–silicon structures grown by the atomic substitution method in a silicon crystal lattice
Vol 51, No 11 (2017) XXI International Symposium “Nanophysics and Nanoelectronics”, Nizhny Novgorod, March 13–16, 2017 MBE growth of ultrathin III–V nanowires on a highly mismatched SiC/Si(111) substrate
Vol 52, No 5 (2018) XXV International Symposium “Nanostructures: Physics and Technology”, Saint Petersburg, Russia, June 26–30, 2017. Nanostructure Technology MBE growth and Structural Properties of InAs and InGaAs Nanowires with Different Mole Fraction of In on Si and Strongly Mismatched SiC/Si(111) Substrates
Vol 52, No 6 (2018) Fabrication, Treatment, and Testing of Materials and Structures Effect of Chemical Treatment of a Silicon Surface on the Quality and Structure of Silicon-Carbide Epitaxial Films Synthesized by Atom Substitution
Vol 53, No 2 (2019) Surfaces, Interfaces, and Thin Films Photoelectric Properties of GaN Layers Grown by Plasma-Assisted Molecular-Beam Epitaxy on Si(111) Substrates and SiC/Si(111) Epitaxial Layers

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