Methods and Technique of Measurements
| Issue | Title | File | |
| Vol 51, No 13 (2017) | Determining the Free Carrier Density in CdxHg1–xTe Solid Solutions from Far-Infrared Reflection Spectra |
 (Eng) |
|
| Belov A.G., Denisov I.A., Kanevskii V.E., Pashkova N.V., Lysenko A.P. | |||
| Vol 50, No 13 (2016) | Study of the structure and composition of the strained epitaxial layer in the InAlAs/GaAs(100) heterostructure by transmission electron microscopy |
(Eng) |
|
| Lovygin M.V., Borgardt N.I., Bugaev A.S., Volkov R.L., Seibt M. | |||
| Vol 50, No 13 (2016) | Measurements of electrophysical characteristics of semiconductor structures with the use of microwave photonic crystals |
(Eng) |
|
| Usanov D.A., Nikitov S.A., Skripal A.V., Ponomarev D.V., Latysheva E.V. | |||
| 1 - 3 of 3 Items | |||