Etching of Disc and Ring Patterns in Si3N4/GaN Structure by Ga+ FIB


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Abstract

The work presents experimental data of Ga+ focused ion beam etching of disc and ring patterns in Si3N4/GaN structure. The reasons for the difference in etching depth between the discs and the rings are described.

About the authors

M. I. Mitrofanov

Ioffe Institute

Author for correspondence.
Email: maxi.mitrofanov@gmail.com
Russian Federation, St. Petersburg, 194021

G. V. Voznyuk

Ioffe Institute

Author for correspondence.
Email: glebufa0@gmail.com
Russian Federation, St. Petersburg, 194021

S. N. Rodin

Ioffe Institute

Author for correspondence.
Email: s_rodin77@mail.ru
Russian Federation, St. Petersburg, 194021

W. V. Lundin

Ioffe Institute

Author for correspondence.
Email: lundin.vpegroup@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021

V. P. Evtikhiev

Ioffe Institute

Author for correspondence.
Email: evtikhiev@mail.ioffe.ru
Russian Federation, St. Petersburg, 194021

A. F. Tsatsulnikov

SHM R and E Center, Russian Academy of Sciences

Author for correspondence.
Email: andrew@beam.ioffe.ru
Russian Federation, St. Petersburg


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