Thermoelectric effects in nanoscale layers of manganese silicide
- Авторлар: Erofeeva I.V.1, Dorokhin M.V.1, Lesnikov V.P.1, Kuznetsov Y.M.1, Zdoroveyshchev A.V.1, Pitirimova E.A.1
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Мекемелер:
- Research Institute for Physics and Technology
- Шығарылым: Том 51, № 11 (2017)
- Беттер: 1403-1408
- Бөлім: XXI International Symposium “Nanophysics and Nanoelectronics”, Nizhny Novgorod, March 13–16, 2017
- URL: https://journals.rcsi.science/1063-7826/article/view/201465
- DOI: https://doi.org/10.1134/S1063782617110112
- ID: 201465
Дәйексөз келтіру
Аннотация
The values of the thermoelectric power, layer resistivity and thermal conductivity of a MnxSi1–x nanoscale layer and MnxSi1–x/Si superlattice on silicon depending on the growth temperature in the range T = 300–600 K are found experimentally. The contribution of the nanoscale film and substrate to the thermoelectric effect is discussed. The thermoelectric figure of merit of a single manganese-ssilicide layer, superlattice, and layer/substrate system is estimated. The largest figure of merit ZT = 0.59 ± 0.06 is found for Mn0.2Si0.8 at T = 600 K.
Авторлар туралы
I. Erofeeva
Research Institute for Physics and Technology
Хат алмасуға жауапты Автор.
Email: irfeya@mail.ru
Ресей, Nizhny Novgorod, 603950
M. Dorokhin
Research Institute for Physics and Technology
Email: irfeya@mail.ru
Ресей, Nizhny Novgorod, 603950
V. Lesnikov
Research Institute for Physics and Technology
Email: irfeya@mail.ru
Ресей, Nizhny Novgorod, 603950
Yu. Kuznetsov
Research Institute for Physics and Technology
Email: irfeya@mail.ru
Ресей, Nizhny Novgorod, 603950
A. Zdoroveyshchev
Research Institute for Physics and Technology
Email: irfeya@mail.ru
Ресей, Nizhny Novgorod, 603950
E. Pitirimova
Research Institute for Physics and Technology
Email: irfeya@mail.ru
Ресей, Nizhny Novgorod, 603950
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