Degradation of micromorphous thin-film silicon (α-Si/μc-Si) solar modules: Evaluation of seasonal efficiency based on the data of monitoring
- Authors: Bogdanov D.A.1,2,3, Gorbatovskii G.A.2, Verbitskii V.N.2, Bobyl A.V.2, Terukov E.I.2,4
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Affiliations:
- Lappeenranta University of Technology
- Ioffe Institute
- St. Petersburg Academic University Nanotechnology—Research and Education Center, Russian Academy of Sciences
- Research and Development Center for Thin-Film Technologies in Power-Engineering at the Ioffe Institute
- Issue: Vol 51, No 9 (2017)
- Pages: 1180-1185
- Section: Physics of Semiconductor Devices
- URL: https://journals.rcsi.science/1063-7826/article/view/201155
- DOI: https://doi.org/10.1134/S106378261709007X
- ID: 201155
Cite item
Abstract
A method for assessing the efficiency of α-Si/μc-Si solar modules is developed; the method is based on monitoring current and voltage at the point of highest voltage and on measuring the temperature at the surface of the module. The technique for assessment of the parameters of the α-Si/μc-Si modules in the course of their operation after initial degradation of the module is described; the results of parameter evaluation are compared with the values measured in the laboratory. The error in evaluating parameters was no larger than 3%; this error amounted to 0.36% in the case of estimating the parameters under standard conditions and maximal power of the module. This method can be used for evaluating a module’s efficiency and for short-term prediction (day, week) of the power generated by a solar power plant under conditions of operation using standard tools for monitoring.
About the authors
D. A. Bogdanov
Lappeenranta University of Technology; Ioffe Institute; St. Petersburg Academic University Nanotechnology—Research and Education Center, Russian Academy of Sciences
Author for correspondence.
Email: dmitrii.bogdanov@lut.fi
Finland, Lappeenranta, 53850; St. Petersburg, 194021; St. Petersburg, 194021
G. A. Gorbatovskii
Ioffe Institute
Email: dmitrii.bogdanov@lut.fi
Russian Federation, St. Petersburg, 194021
V. N. Verbitskii
Ioffe Institute
Email: dmitrii.bogdanov@lut.fi
Russian Federation, St. Petersburg, 194021
A. V. Bobyl
Ioffe Institute
Email: dmitrii.bogdanov@lut.fi
Russian Federation, St. Petersburg, 194021
E. I. Terukov
Ioffe Institute; Research and Development Center for Thin-Film Technologies in Power-Engineering at the Ioffe Institute
Email: dmitrii.bogdanov@lut.fi
Russian Federation, St. Petersburg, 194021; St. Petersburg, 194064