| 期 | 
        标题 | 
        文件 | 
		| 卷 63, 编号 9 (2018) | 
	Analytical Description of Avalanche Photodiode Characteristics. An Overview: Part II | 
	
									  (Eng)
						 | 
	| 
		Burlakov I., Filachev A., Kholodnov V.
	 | 
		| 卷 63, 编号 9 (2018) | 
	Admittance of MIS Structures Based on MBE Hg1 – xCdxTe (x = 0.21–0.23) in a Wide Temperature Range | 
	
									  (Eng)
						 | 
	| 
		Voitsekhovskii A., Kulchitsky N., Nesmelov S., Dzyadukh S.
	 | 
		| 卷 63, 编号 9 (2018) | 
	Current–Voltage Characteristics of n-B-p Structures with Absorbing In0.53Ga0.47As Layer | 
	
									  (Eng)
						 | 
	| 
		Sednev M., Boltar K., Irodov N., Demidov S.
	 | 
		| 卷 63, 编号 9 (2018) | 
	To the Problem of Optimization of Parameters of a Double Heterostructure Based on Direct-Gap Semiconductors for Avalanche Photodiodes | 
	
									  (Eng)
						 | 
	| 
		Kholodnov V., Burlakov I.
	 | 
		| 卷 63, 编号 9 (2018) | 
	Multi-Row Photodetectors for the Short Wavelength IR Region Based on HgCdTe Heteroepitaxial Structures | 
	
									  (Eng)
						 | 
	| 
		Iakovleva N., Boltar K., Nikonov A., Egorov A.
	 | 
		| 卷 63, 编号 3 (2018) | 
	Influence of Indirect Transitions on Optical Characteristics of A3B5 Heteroepitaxial Layers | 
	
									  (Eng)
						 | 
	| 
		Nikonov A., Iakovleva N.
	 | 
		| 卷 63, 编号 3 (2018) | 
	Impact of the Graded-Gap Layer on the Admittance of MIS Structures Based on MBE-Grown n-Hg1 – xCdxTe (x = 0.22–0.23) with the Al2O3 Insulator | 
	
									  (Eng)
						 | 
	| 
		Voitsekhovskii A., Nesmelov S., Dzyadukh S., Vasil’ev V., Varavin V., Dvoretsky S., Mikhailov N., Yakushev M., Sidorov G.
	 | 
		| 卷 63, 编号 3 (2018) | 
	Long-Term Stability of a 640 × 512 InSb Focal Plane Array with a Pitch of 15 μm | 
	
									  (Eng)
						 | 
	| 
		Vlasov P.
	 | 
		| 卷 63, 编号 3 (2018) | 
	Contactless Measurement of Electron Concentration in Undoped Homoepitaxial InSb Layers | 
	
									  (Eng)
						 | 
	| 
		Komkov O., Firsov D., Lvova T., Sedova I., Solov’ev V., Semenov A., Ivanov S.
	 | 
		| 卷 63, 编号 3 (2018) | 
	Scanning Thermal Imaging Device Based on a Domestic Photodetector Device | 
	
									  (Eng)
						 | 
	| 
		Kremis I., Kalinin V., Fedorinin V., Korsakov Y., Shatunov K.
	 | 
		| 卷 63, 编号 3 (2018) | 
	InGaAs/AlGaAs QWIP Heterostructures for Large-Format Focal Plane Arrays Photosensitive in the Spectral Range 3–5 μm | 
	
									  (Eng)
						 | 
	| 
		Dudin A., Katsavets N., Krasovitsky D., Kokin S., Chaly V., Shukov I.
	 | 
		| 卷 63, 编号 3 (2018) | 
	Long-Wave Infrared Focal Plane Arrays Based on a Quantum-Well AlGaAs/GaAs Structure with 384 × 288 Elements | 
	
									  (Eng)
						 | 
	| 
		Boltar K., Burlakov I., Vlasov P., Lopukhin A., Chaliy V., Katsavets N.
	 | 
		| 卷 63, 编号 3 (2018) | 
	Precision Etching of Thin Doped Silicon Layers | 
	
									  (Eng)
						 | 
	| 
		Borovkova A., Grischina T., Matyuhina E.
	 | 
		| 卷 63, 编号 3 (2018) | 
	Methods for Calculation and Control of the Impurity Difference Dose in Avalanche InGaAs/InP Structures | 
	
									  (Eng)
						 | 
	| 
		Budtolaev A., Kravchenko N., Khakuashev P., Chinareva I.
	 | 
		| 卷 63, 编号 3 (2018) | 
	Analysis of Misorientation of Single-Crystal Blocks in the Bulk InSb Crystal | 
	
									  (Eng)
						 | 
	| 
		Shabrin A., Goncharov A., Pashkeev D., Lyalikov A., Egorov A.
	 | 
		| 卷 62, 编号 3 (2017) | 
	Methods for measuring the current–voltage characteristics of photodiodes in a multirow infrared photodetector | 
	
									  (Eng)
						 | 
	| 
		Baliev D., Boltar K.
	 | 
		| 卷 62, 编号 3 (2017) | 
	A 1280 × 1024 CMOS visible-range photodetector chip with a pixel size of 13 × 13 μm | 
	
									  (Eng)
						 | 
	| 
		Borodin D., Osipov Y., Vasil’ev V.
	 | 
		| 卷 62, 编号 3 (2017) | 
	Epitaxial structures for InGaAs/InP avalanche photodiodes | 
	
									  (Eng)
						 | 
	| 
		Budtolaev A., Khakuashev P., Chinareva I., Gorlachuk P., Ladugin M., Marmaluk A., Ryaboshtan Y., Yarotskaya I.
	 | 
		| 卷 62, 编号 3 (2017) | 
	Photoelectric characteristics of focal plane arrays based on epitaxial layers of indium antimonide deposited on a heavily doped substrate | 
	
									  (Eng)
						 | 
	| 
		Burlakov I., Boltar K., Vlasov P., Lopukhin A., Toropov A., Zhuravlev K., Fadeev V.
	 | 
		| 卷 62, 编号 3 (2017) | 
	Analysis of the nBn-type barrier structures for infrared photodiode detectors | 
	
									  (Eng)
						 | 
	| 
		Voitsekhovskii A., Gorn D.
	 | 
		| 卷 62, 编号 3 (2017) | 
	Analysis of the spatial distribution of the spectral photosensitivity of focal plane arrays | 
	
									  (Eng)
						 | 
	| 
		Davletshin R., Lazarev P., Nikonov A.
	 | 
		| 卷 62, 编号 3 (2017) | 
	Structural properties of cadmium–zinc–tellurium substrates for growth of mercury–cadmiumtellurium solid solutions | 
	
									  (Eng)
						 | 
	| 
		Pryanikova E., Mirofyanchenko A., Burlakov I., Smirnova N., Silina A., Grishechkin M., Denisov I., Shmatov N.
	 | 
		| 卷 62, 编号 3 (2017) | 
	Independent operation time of photodetectors of the (3—5)-μm spectral band based on InSb and CdHgTe heteroepitaxial structures | 
	
									  (Eng)
						 | 
	| 
		Filatov A., Susov E., Karpov V., Zhilkin V., Ljubchenko S., Kusnezov N., Marushchenko A.
	 | 
		| 卷 62, 编号 3 (2017) | 
	Investigation of spectral dependences of the absorption coefficient in InGaAs layers | 
	
									  (Eng)
						 | 
	| 
		Iakovleva N., Nikonov A.
	 | 
		| 卷 61, 编号 10 (2016) | 
	Experimental investigation and calculation of the spectral dependence of the absorption coefficient of single-layer epitaxial HgCdTe structures | 
	
									  (Eng)
						 | 
	| 
		Iakovleva N., Nikonov A., Shabarov V.
	 | 
	
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